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| INCH-POUND MIL-M-38510/14E 21 March 2005__ SUPERSEDING MIL-M-38510/14D 2 August 1982 MILITARY SPECIFICATION MICROCIRCUITS, DIGITAL, TTL, DATA SELECTORS/MULTIPLEXERS, MONOLITHIC SILICON Inactive for new design after 7 September 1995. This specification is approved for use by all Departments and Agencies of the Department of Defense. The requirements for acquiring the product herein shall consist of this specification sheet and MIL-PRF 38535 1. SCOPE 1.1 Scope. This specification covers the detail requirements for monolithic, silicon, TTL, data selectors/multiplexers, logic microcircuits. Two product assurance classes and a choice of case outlines and lead finishes are provided and are reflected in the complete part number. For this product, the requirements of MIL-M38510 have been superseded by MIL-PRF-38535, (see 6.4). 1.2 Part or Identifying Number (PIN). The PIN is in accordance with MIL-PRF-38535, and as specified herein. 1.2.1 Device types. The device types are as follows: Device type 01 02, 06 03 04 05 Circuit Sixteen-input data selector/multiplexer, with enable Eight-input data selector/multiplexer, with enable Dual, four-input data selector/multiplexer, with enable Dual, four-input data selector/multiplexer, without enable Quad, two-input data selector/multiplexer, with enable 1.2.2 Device class. The device class is the product assurance level as defined in MIL-PRF-38535. 1.2.3 Case outlines. The case outlines are as designated in MIL-STD-1835 and as follows: Outline letter E F J K Z Descriptive designator GDIP1-T16 or CDIP2-T16 GDFP2-F16 or CDFP3-F16 GDIP1-T24 or CDIP2-T24 GDFP2-F24 or CDFP3-F24 GDFP7-F24 or CDFP8-F24 Terminals 16 16 24 24 24 Package style Dual-in-line Flat-pack Dual-in-line Flat-pack Flat-pack Comments, suggestions, or questions on this document should be addressed to: Commander, Defense Supply Center Columbus, ATTN: DSCC-VAS, P. O. Box 3990, Columbus, OH 43218-3990, or emailed to bipolar@dscc.dla.mil. Since contact information can change, you may want to verify the currency of this address information using the ASSIST Online database at http://assist.daps.dla.mil. AMSC N/A FSC 5962 MIL-M-38510/14E 1.3 Absolute maximum ratings. Supply voltage range ...................................................... Input voltage range ......................................................... Storage temperature range ............................................ Maximum power dissipation per gate, (PD) 1/ Device type 01 ........................................................ Device types 02 and 06 ........................................... Device type 03 ........................................................ Device type 04 ........................................................ Device type 05 ........................................................ Lead temperature (soldering 10 seconds) ...................... Thermal resistance, junction-to-case (JC)...................... Junction temperature (TJ ) 2/ .......................................... 1.4 Recommended operating conditions. Supply voltage (VCC) ....................................................... Minimum high level input voltage (VIH) ........................... Maximum low level input voltage (VIL) ............................ Maximum low level output current (IIL) ............................ Normalized fanout (each output) 3/ Low logic level ......................................................... High logic level ........................................................ Case operating temperature range (TC ) ......................... 2.0 APPLICABLE DOCUMENT 2.1 General. The documents listed in this section are specified in sections 3, 4, or 5 of this specification. This section does not include documents cited in other sections of this specification or recommended for additional information or as examples. While every effort has been made to ensure the completeness of this list, document users are cautioned that they must meet all specified requirements of documents cited in sections 3, 4, or 5 of this specification, whether or not they are listed. 2.2 Government documents. 2.2.1 Specifications and standards. The following specifications and standards form a part of this specification to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the solicitation or contract. DEPARTMENT OF DEFENSE SPECIFICATIONS MIL-PRF-38535 Integrated Circuits (Microcircuits) Manufacturing, General Specification for. 4.5 V minimum to 5.5 V maximum 2.0 V dc 0.8 V dc 16 mA 10 maximum 20 maximum -55C to 125C -0.5 V to +7.0 V -1.5 V at -12 mA to +5.5 V -65C to +150C 375 mW 268 mW 286 mW 248 mW 275 mW 300C (See MIL-STD-1835) 175C DEPARTMENT OF DEFENSE STANDARDS MIL-STD-883 MIL-STD-1835 Test Method Standard for Microelectronics. Interface Standard Electronic Component Case Outlines (Copies of these documents are available online at http://assist.daps.dla.mil/quicksearch/ or http://assist.daps.dla.mil or from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.) _______ 1/ Must withstand the added PD due to short circuit condition (e.g. IOS test). 2/ Maximum junction temperature should not be exceeded except in accordance with allowable short duration burn-in screening condition in accordance with MIL-PRF-38535. 3/ Device will fanout in both high and low levels to the specified number of inputs of the same device type as that being tested. 2 MIL-M-38510/14E 2.3 Order of precedence. In the event of a conflict between the text of this specification and the references cited herein, the text of this document takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. REQUIREMENTS 3.1 Qualification. Microcircuits furnished under this specification shall be products that are manufactured by a manufacturer authorized by the qualifying activity for listing on the applicable qualified manufacturers list before contract award (see 4.3 and 6.3). 3.2 Item requirements. The individual item requirements shall be in accordance with MIL-PRF-38535 and as specified herein or as modified in the device manufacturer's Quality Management (QM) plan. The modification in the QM plan shall not affect the form, fit, or function as described herein. 3.3 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in MIL-PRF-38535 and herein. 3.3.1 Logic diagrams and terminal connections. The logic diagrams and terminal connections shall be as specified on figure 1 and 2. 3.3.2 Truth tables. The truth tables shall be as specified on figure 3. 3.3.4 Schematic circuit. The schematic circuit shall be maintained by the manufacturer and made available to the qualifying activity and the preparing activity upon request. 3.3.5 Case outlines. Case outlines shall be as specified in 1.2.3. 3.4 Lead material and finish. Lead material and finish shall be in accordance with MIL-PRF-38535 (see 6.6). 3.5 Electrical performance characteristics. The electrical performance characteristics are as specified in table 1 and apply over the full recommended case operating temperature range, unless otherwise specified. 3.6 Electrical test requirements. The electrical test requirements for each device class shall be the subgroups specified in table II. The electrical tests for each subgroup are described in table III. 3.7 Marking. Marking shall be in accordance with MIL-PRF-38535. 3.8 Microcircuit group assignment. The devices covered by this specification shall be in microcircuit group number 4 (see MIL-PRF-38535, appendix A). 3 MIL-M-38510/14E TABLE I. Electrical performance characteristics. Test Symbol Conditions -55C TC +125C unless otherwise specified VCC = 4.5 V IOH = -.8 mA Low level output voltage Input clamp voltage VOL VIC IIL VCC = 4.5 V IOL = 16 mA VCC = 4.5 V IIN = -12 mA Low level input current VCC = 5.5 V VIN = 0.4 V High-level input current High-level input current Short circuit output current 02, 03, 04 05, 06 01 All All 01, 03, 06 02, 04, 05 01 02,06 04 03 05 01 01 01 01 01 01 -20 -20 -0.7 -1.6 mA All -1.5 V All 0.4 V Device type All Limits Min Max 2.4 Unit High level output voltage VOH V -0.6 -1.6 40 100 -55 -120 68 48 45 52 50 40 43 37 32 23 30 A A mA mA mA mA mA mA mA ns ns ns ns ns ns IIH1 IIH2 IOS VCC = 5.5 V VIN = 2.5 V VCC = VIN = 5.5 V VCC = 5.5 V VOUT = 0 V 1/ Supply current ICC VCC = 5.5 V Propagation delay time high-to-low level output from A, B, C or D to W Propagation delay time low-to-high level output from A, B, C or D to W Propagation delay time high-to-low level output from strobe to W Propagation delay time low-to-high level output from strobe to W Propagation delay time high-to-low level output from E0-E15 to W Propagation delay time low-to-high level output from E0-E15 to W tPHL1 tPLH1 tPHL2 tPLH2 tPHL3 tPLH3 RL = 390 5%, CL = 50 pF minimum (figure 4) 8 8 6 6 3 3 1/ Not more than one should be shorted at one time. 4 MIL-M-38510/14E TABLE I. Electrical performance characteristics - Continued. Conditions -55C TC +125C unless otherwise specified RL = 390 5%, CL = 50 pF minimum (figure 4) Device type 02 06 02 06 02 06 02 06 02 06 02, 06 02 06 02 06 02, 06 02, 06 02 06 tPLH6 tPHL1 tPLH1 tPHL2 tPLH2 tPHL3 tPLH3 RL = 390 5%, CL = 50 pF minimum (figure 5) 02 06 03 03 03 03 03 03 Limits Min Max 6 6 6 6 8 8 8 8 6 6 6 8 8 8 8 3 3 6 6 6 6 3 3 6 6 6 6 40 48 38 43 49 60 45 58 37 38 35 46 52 42 52 32 26 41 44 33 36 29 28 44 42 32 42 ns ns ns ns ns ns ns Test Propagation delay time, high-to-low level output from A, B, or C to W Propagation delay time, low-to-high level output from A, B, or C to W Propagation delay time, high-to-low level output from A, B, or C to Y Propagation delay time, low-to-high level output from A, B, or C to Y Propagation delay time, high-to-low level output from strobe to W Propagation delay time, low-to-high level output from strobe to W Propagation delay time, high-to-low level output from strobe to Y Propagation delay time, low-to-high level output from strobe to Y Propagation delay time, high-to-low level output from D0-D7 to W Propagation delay time, low-to-high level output from D0-D7 to W Propagation delay time, high-to-low level output from D0-D7 to Y Propagation delay time, low-to-high level output from D0-D7 to Y Propagation delay time, high-to-low level output from data to Y Propagation delay time, low-to-high level output from data to Y Propagation delay time, high-to-low level output from A or B to Y Propagation delay time, low-to-high level output from A or B to Y Propagation delay time, high-to-low level output from strobe to Y Propagation delay time, low-to-high level output from strobe to Y Symbol tPHL1 tPLH1 tPHL2 tPLH2 tPHL3 tPLH3 tPHL4 tPLH4 tPHL5 tPLH5 tPHL6 Unit ns ns ns ns ns ns ns ns ns ns ns 5 MIL-M-38510/14E TABLE I. Electrical performance characteristics - Continued. Conditions -55C TC +125C unless otherwise specified RL = 390 5%, CL = 50 pF minimum (figure 5) Device type 04 04 04 04 04 04 04 04 RL = 390 5%, CL = 50 pF minimum (figure 6) 05 05 05 05 05 05 Limits Min Max 3 3 3 3 6 6 6 6 6 6 3 3 3 3 41 39 25 24 51 51 39 34 49 41 39 33 25 35 Test Propagation delay time high-to-low level output from data to Y Propagation delay time low-to-high level output from data to Y Propagation delay time high-to-low level output from data to W Propagation delay time low-to-high level output from data to W Propagation delay time high-to-low level output from A or B to Y Propagation delay time low-to-high level output from A or B to Y Propagation delay time high-to-low level output from A or B to W Propagation delay time low-to-high level output from A or B to W Propagation delay time high-to-low level output from A to Y Propagation delay time low-to-high level output from A to Y Propagation delay time high-to-low level output from strobe to Y Propagation delay time low-to-high level output from strobe to Y Propagation delay time high-to-low level output from data to Y Propagation delay time low-to-high level output from data to Y Symbol tPHL1 tPLH1 tPHL2 tPLH2 tPHL3 tPLH3 tPHL4 tPLH4 tPHL1 tPLH1 tPHL2 tPLH2 tPHL3 tPLH3 Unit ns ns ns ns ns ns ns ns ns ns ns ns ns ns 6 MIL-M-38510/14E TABLE II. Electrical test requirements. Subgroups (see table III) MIL-PRF-38535 Test requirement Interim electrical parameters Final electrical test parameters Group A test requirements Group B electrical test parameters when using the method 5005 QCI option Groups C end point electrical parameters Group D end point electrical parameters Class S Devices 1 1*, 2, 3, 7, 9, 10, 11 1, 2, 3, 7, 8, 9, 10, 11 1, 2, 3 1, 2, 3 1, 2, 3 1 1*, 2, 3, 7, 9 1, 2, 3, 7, 8 9, 10, 11 N/A 1, 2, 3 1, 2, 3 Class B Devices *PDA applies to subgroup 1. 4. VERIFICATION 4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38535 or as modified in the device manufacturer's Quality Management (QM) plan. The modification in the QM plan shall not effect the form, fit, or function as described herein. 4.2 Screening. Screening shall be in accordance with MIL-PRF-38535 and shall be conducted on all devices prior to qualification and conformance inspection. The following additional criteria shall apply: a. The burn-in test duration, test condition, and test temperature, or approved alternatives shall be as specified in the device manufacturer's QM plan in accordance with MIL-PRF-38535. The burn-in test circuit shall be maintained under document control by the device manufacturer's Technology Review Board (TRB) in accordance with MIL-PRF-38535 and shall be made available to the acquiring or preparing activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in test method 1015 of MIL-STD-883. b. Interim and final electrical test parameters shall be as specified in table II, except interim electrical parameters test prior to burn-in is optional at the discretion of the manufacturer. c. Additional screening for space level product shall be as specified in MIL-PRF-38535. 7 MIL-M-38510/14E 4.3 Qualification inspection. Qualification inspection shall be in accordance with MIL-PRF-38535. 4.4 Technology Conformance Inspection (TCI). Technology conformance inspection shall be in accordance with MIL-PRF-38535 and herein for groups A, B, C, and D inspections (see 4.4.1 through 4.4.4). 4.4.1 Group A inspection. Group A inspection shall be in accordance with table III of MIL-PRF-38535 and as follows: a. Tests shall be as specified in table II herein. b. Subgroups 4, 5, and 6, shall be omitted. 4.4.2 Group B inspection. Group B inspection shall be in accordance with table II of MIL-PRF-38535. 4.4.3 Group C inspection. Group C inspection shall be in accordance with table IV of MIL-PRF-38535 and as follows: a. End point electrical parameters shall be as specified in table II herein. b. The steady-state life test duration, test condition, and test temperature, or approved alternatives shall be as specified in the device manufacturer's QM plan in accordance with MIL-PRF-38535. The burn-in test circuit shall be maintained under document control by the device manufacturer's Technology Review Board (TRB) in accordance with MIL-PRF-38535 and shall be made available to the acquiring or preparing activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in test method 1005 of MIL-STD-883. 4.4.4 Group D inspection. Group D inspection shall be in accordance with table V of MIL-PRF-38535. End-point electrical parameters shall be as specified in table II herein. 4.5 Methods of inspection. Methods of inspection shall be as specified in the appropriate tables and as follows: 4.5.1 Voltage and current. All voltages given are referenced to the microcircuit ground terminal. Currents given are conventional current and positive when flowing into the referenced terminal. 8 MIL-M-38510/14E Figure 1. Terminal connections (top view). 9 MIL-M-38510/14E Figure 1. Terminal connections (top view) - Continued. 10 MIL-M-38510/14E Figure 1. Terminal connections (top view) - Continued. 11 MIL-M-38510/14E Figure 2. Logic diagrams. 12 MIL-M-38510/14E Figure 2. Logic diagrams - Continued. 13 MIL-M-38510/14E Figure 2. Logic diagrams - Continued. 14 MIL-M-38510/14E Figure 2. Logic diagrams - Continued. 15 MIL-M-38510/14E Device type 01 INPUTS D X L L L L L L L L L L L L L L L L H H H H H H H H H H H H H H H H C X L L L L L L L L H H H H H H H H L L L L L L L L H H H H H H H H B X L L L L H H H H L L L L H H H H L L L L H H H H L L L L H H H H A STROBE E0 X L L H H L L H H L L H H L L H H L L H H L L H H L L H H L L H H H L L L L L L L L L L L L L L L L L L L L L L L L L L L L L L L L x L H x x x x x x x x x x x x x x x x x x x x x x x x x x x x x x E1 x x x L H x x x x x x x x x x x x x x x x x x x x x x x x x x x x E2 x x x x x L H x x x x x x x x x x x x x x x x x x x x x x x x x x E3 x x x x x x x L H x x x x x x x x x x x x x x x x x x x x x x x x E4 x x x x x x x x x L H x x x x x x x x x x x x x x x x x x x x x x E5 x x x x x x x x x x x L H x x x x x x x x x x x x x x x x x x x x E6 x x x x x x x x x x x x x L H x x x x x x x x x x x x x x x x x x E7 x x x x x x x x x x x x x x x L H x x x x x x x x x x x x x x x x E8 x x x x x x x x x x x x x x x x x L H x x x x x x x x x x x x x x E9 E10 E11 E12 E13 E14 E15 x x x x x x x x x x x x x x x x x x x L H x x x x x x x x x x x x x x x x x x x x x x x x x x x x x x x x x L H x x x x x x x x x x x x x x x x x x x x x x x x x x x x x x x x x L H x x x x x x x x x x x x x x x x x x x x x x x x x x x x x x x x x L H x x x x x x x x x x x x x x x x x x x x x x x x x x x x x x x x x L H x x x x x x x x x x x x x x x x x x x x x x x x x x x x x x x x x L H x x x x x x x x x x x x x x x x x x x x x x x x x x x x x x x x x L H OUTPUT W H H L H L H L H L H L H L H L H L H L H L H L H L H L H L H L H L When used to indicate an input condition, X = High logic level or low logic level. Figure 3. Truth tables. 16 MIL-M-38510/14E Device types 02 and 06 INPUTS C X L L L L L L L L H H H H H H H H B X L L L L H H H H L L L L H H H H A X L L H H L L H H L L H H L L H H STROBE H L L L L L L L L L L L L L L L L D0 x L H x x x x x x x x x x x x x x D1 x x x L H x x x x x x x x x x x x D2 x x x x x L H x x x x x x x x x x D3 x x x x x x x L H x x x x x x x x D4 x x x x x x x x x L H x x x x x x D5 x x x x x x x x x x x L H x x x x D6 x x x x x x x x x x x x x L H x x D7 x x x x x x x x x x x x x x x L H OUTPUTS Y L L H L H L H L H L H L H L H L H W H H L H L H L H L H L H L H L H L When used to indicate an input, X = Irrelevant. H = High level, L = Low level. ADDRESS INPUTS B A X L L L L H H H H X L L H H L L H H DATA INPUTS C0 x L H x x x x x x C1 x x x L H x x x x C2 x x x x x L H x x C3 x x x x x x x L H STROBE G H L L L L L L L L OUTPUT Y L L H L H L H L H Address inputs A and B are common to both sections. H = high level, L = low level, X = irrelevant. Figure 3. Truth tables - Continued. 17 MIL-M-38510/14E Device type 04 Address inputs B A L L L L H H H H L L H H L L H H Data inputs C0 L H X X X X X X C1 X X L H X X X X C2 X X X X L H X X C3 X X X X X X L H Outputs Y L H L H L H L H W H L H L H L H L Address inputs A and B are common to both sections. H = High level, L = Low level, X = Irrelevant. Device type 05 Strobe (enable) G H L L L L Select input A X H H L L Data inputs B0 X X X L H B1 X L H X X Output Y L L H L H Address A and strobe G are common to all sections. H = High level, L = Low level, X = Irrelevant. FIGURE 3. Truth tables - Continued. 18 MIL-M-38510/14E FIGURE 4. Switching test for device types 01, 02, and 06. 19 MIL-M-38510/14E NOTES: 1. The input pulse has the following characteristics: VOH = 3 V, VOL = 0 V, t1 = t0 = 10 ns, tp = 500 ns, PRR 1 MHz, duty cycle = 50% 15%, and generator Zout 50. 2. 3. 4. CL includes probe and jig capacitance. All diodes are 1N3064 or equivalent. Load circuits on a given output are only required where the specific test given in table III indicates "OUT" on that output. Load circuits may otherwise be omitted. FIGURE 4. Switching test for device types 01, 02, and 06 - Continued. 20 MIL-M-38510/14E VOLTAGE WAVEFORMS Switching time CN to Y (types 03 and 04) CN to W (type 04 only) A or B to Y (types 03 and 04) A or B to W (type 04 only) G to Y (type 03 only) Output waveform A B A B B NOTES: 1. The pulse generator has the following characteristics: PRR 1 MHz, duty cycle = 50% 15% and Zout 50. 2. 3. 4. CL = 50 pF 10% and includes probe and jig capacitance. All diodes are 1N3064, or equivalent. Load circuits on a given output are only required where the specific test given in table III indicates "OUT" on that output. Load circuits may otherwise be omitted. FIGURE 5. Switching test for device types 03 and 04. 21 MIL-M-38510/14E VOLTAGE WAVEFORMS Input A to Y B to Y S to Y Output waveform A A B NOTES: 1. The pulse generator has the following characteristics: PRR 1 MHz, duty cycle = 50% 15% and Zout 50. 2. 3. 4. CL = 50 pF 10% and includes probe and jig capacitance. All diodes are 1N3064 or equivalent. Load circuits on a given output are only required where the specific test given in table III indicates "OUT" on that output. Load circuits may otherwise be omitted. FIGURE 6. Switching test for device type 05. 22 TABLE III. Group A inspection for device type 01. Terminal conditions (pins not designated may be H 2.0 V, or L 0.8 V, or open). Subgroup 1 TC = 25C " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " Symbol VOH VOL VIC " " " " " " " " " " " " " " " " " " " " IIL " " " " " " " " " " " " " " " " " " " " 3009 " " " " " " " " " " " " " " " " " " " " MILSTD-883 method 3006 3007 Cases J, K, Z Test No. 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 32 33 34 35 36 37 38 39 40 41 42 43 44 0.4 V 0.4 V 0.4 V 0.4 V 0.4 V 0.4 V 0.4 V 2.0 V 1 E7 2 E6 3 E5 4 E4 5 E3 6 E2 7 E1 8 E0 9 G 2.0 V 0.8 V 10 W -.8mA 16mA GND 11 D 12 GND GND " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " Meas. terminal W W A B C D G E0 E1 E2 E3 E4 E5 E6 E7 E8 E9 E10 E11 E12 E13 E14 E15 E0 E1 E2 E3 E4 E5 E6 E7 E8 E9 E10 E11 E12 E13 E14 E15 Test limits Min 2.4 0.4 -1.5 " " " " " " " " " " " " " " " " " " " " -0.7 1/ " " " " " " " " " " " " " " " " " " " -1.6 " " " " " " " " " " " " " " " " " " " " Max Unit V V V " " " " " " " " " " " " " " " " " " " " mA " " " " " " " " " " " " " " " " " " " " -12mA -12mA -12mA -12mA -12mA -12mA -12mA -12mA -12mA -12mA MIL-M-38510/14E 23 0.4 V GND " " " " " " " " " " " " " " " 0.4 V GND " " " " " " " 5.5 V " " " " " " " 0.4 V G A B C D TABLE III. Group A inspection for device type 01. Terminal conditions (pins not designated may be H 2.0 V, or L 0.8 V, or open). Subgroup 1 TC = 25C " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " Symbol VOH VOL VIC " " " " " " " " " " " " " " " " " " " " IIL " " " " " " " " " " " " " " " " " " " " 3009 " " " " " " " " " " " " " " " " " " " " MILSTD-883 method 3006 3007 Cases J, K, Z Test No. 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 32 33 34 35 36 37 38 39 40 41 42 43 44 GND GND -12mA -12mA GND -12mA 13 C 14 B 15 A 16 E15 17 E14 18 E13 19 E12 20 E11 21 E10 22 E9 23 E8 24 VCC 4.5 V " " " " " " " " " " " " " " " " " " " " " " 5.5 V " " " " " " " " " " " " " " " " " " " " Meas. terminal W W A B C D G E0 E1 E2 E3 E4 E5 E6 E7 E8 E9 E10 E11 E12 E13 E14 E15 E0 E1 E2 E3 E4 E5 E6 E7 E8 E9 E10 E11 E12 E13 E14 E15 Test limits Min 2.4 0.4 -1.5 " " " " " " " " " " " " " " " " " " " " -0.7 1/ " " " " " " " " " " " " " " " " " " " -1.6 " " " " " " " " " " " " " " " " " " " " Max Unit V V V " " " " " " " " " " " " " " " " " " " " mA " " " " " " " " " " " " " " " " " " " " MIL-M-38510/14E -12mA -12mA -12mA -12mA -12mA -12mA -12mA -12mA GND " " " 5.5 V " " " GND " " " 5.5 V " " " GND GND 5.5 V 5.5 V GND GND 5.5 V 5.5 V GND GND 5.5 V 5.5 V GND GND 5.5 V 5.5 V GND 5.5 V GND 5.5 V GND 5.5 V GND 5.5 V GND 5.5 V GND 5.5 V GND 5.5 V GND 5.5 V 0.4 V 0.4 V 0.4 V 24 0.4 V 0.4 V 0.4 V 0.4 V 0.4 V 0.4 V 0.4 V 0.4 V G A B C D See note at end of device type 01. TABLE III. Group A inspection for device type 01 - Continued. Terminal conditions (pins not designated may be H 2.0 V, or L 0.8 V, or open). Subgroup 1 TC = 25C " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " 2 3 Symbol IIH1 " " " " " " " " " " " " " " " " " " " " IIH2 " " " " " " " " " " " " " " " " " " " " IOS ICC MILSTD-883 method 3010 " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " 3011 3005 Cases J, K, Z Test No. 45 46 47 48 49 50 51 52 53 54 55 56 57 58 59 60 61 62 63 64 65 66 67 68 69 70 71 72 73 74 75 75 77 78 79 80 81 82 83 84 85 86 87 88 2.4 V 2.4 V 1 E7 2 E6 3 E5 4 E4 5 E3 6 E2 7 E1 8 E0 9 G 2.4 V GND GND GND 2.4 V 5.5 V " " " " " " " GND " " " " " " " GND GND GND 5.5 V " " " " " " " " GND " " " " " " " GND GND 5.5 V 10 W 11 D 12 GND GND " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " Meas. terminal G A B C D E0 E1 E2 E3 E4 E5 E6 E7 E8 E9 E10 E11 E12 E13 E14 E15 Test limits Min Max 40 " " " " " " " " " " " " " " " " " " " " 100 " " " " " " " " " " " " " " " " " " " " -20 -55 68 Unit A " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " mA mA 2.4 V 2.4 V 2.4 V 2.4 V 2.4 V 2.4 V 5.5 V " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " GND 5.5 V 25 G A B C D E0 E1 E2 E3 E4 E5 E6 E7 E8 E9 E10 E11 E12 E13 E14 E15 MIL-M-38510/14E 5.5 V 5.5 V 5.5 V 5.5 V 5.5 V 5.5 V 5.5 V 5.5 V GND W VCC Same tests, terminal conditions and limits as subgroup 1, except TC = 125C and VIC are omitted. Same tests, terminal conditions and limits as subgroup 1, except TC = -55C and VIC are omitted. TABLE III. Group A inspection for device type 01 - Continued. Terminal conditions (pins not designated may be H 2.0 V, or L 0.8 V, or open). Subgroup 1 TC = 25C " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " 2 3 Symbol IIH1 " " " " " " " " " " " " " " " " " " " " IIH2 " " " " " " " " " " " " " " " " " " " " IOS ICC MILSTD-883 method 3010 " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " 3011 3005 Cases J, K, Z Test No. 45 46 47 48 49 50 51 52 53 54 55 56 57 58 59 60 61 62 63 64 65 66 67 68 69 70 71 72 73 74 75 75 77 78 79 80 81 82 83 84 85 86 87 88 GND GND 2.4 V GND 5.5 V " " " GND " " " 5.5 V " " " GND " " " GND GND GND 5.5 V GND 5.5 V " " " GND " " " 5.5 V " " " GND " " " GND 5.5 V GND 2.4 V GND GND 5.5 V 5.5 V GND GND 5.5 V 5.5 V GND GND 5.5 V 5.5 V GND GND 5.5 V 5.5 V GND GND GND GND 5.5 V GND GND 5.5 V 5.5 V GND GND 5.5 V 5.5 V GND GND 5.5 V 5.5 V GND GND 5.5 V 5.5 V GND GND GND 5.5 V 5.5 V GND GND GND 5.5 V GND 5.5 V GND 5.5 V GND 5.5 V GND 5.5 V GND 5.5 V GND 5.5 V GND 5.5 V GND GND 5.5 V 2.4 V GND GND GND 5.5 V GND 5.5 V GND 5.5 V GND 5.5 V GND 5.5 V GND 5.5 V GND 5.5 V GND 5.5 V GND 2.4 V 2.4 V 2.4 V 2.4 V 2.4 V 2.4 V 2.4 V 2.4 V 13 C 14 B 15 A 16 E15 17 E14 18 E13 19 E12 20 E11 21 E10 22 E9 23 E8 24 VCC 5.5 V " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " Meas. terminal G A B C D E0 E1 E2 E3 E4 E5 E6 E7 E8 E9 E10 E11 E12 E13 E14 E15 Test limits Min Max 40 " " " " " " " " " " " " " " " " " " " " 100 " " " " " " " " " " " " " " " " " " " " -20 -55 68 Unit A " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " mA mA 26 MIL-M-38510/14E G A B C D E0 E1 E2 E3 E4 E5 E6 E7 E8 E9 E10 E11 E12 E13 E14 E15 5.5 V 5.5 V 5.5 V 5.5 V 5.5 V 5.5 V 5.5 V 5.5 V W VCC Same tests, terminal conditions and limits as subgroup 1, except TC = 125C and VIC are omitted. Same tests, terminal conditions and limits as subgroup 1, except TC = -55C and VIC are omitted. See note at end of device type 01. TABLE III. Group A inspection for device type 01 - Continued. Terminal conditions (pins not designated may be H 2.0 V, or L 0.8 V, or open). Subgroup 7 TC = 25C " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " 8 9 TC = 25C " " " " Symbol Truth table test " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " MILSTD-883 method 3014 " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " Cases J, K, Z Test No. 89 90 91 92 93 94 95 96 97 98 99 100 101 102 103 104 105 106 107 108 109 110 111 112 113 114 115 116 117 118 119 120 121 1 E7 2 E6 3 E5 4 E4 5 E3 6 E2 7 E1 8 E0 B A 9 G A 2/ B " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " GND " " " GND " " " IN IN 10 W H 3/ H L H L H L H L H L H L H L H L H L H L H L H L H L H L H L H L OUT " " " OUT " " " OUT OUT 11 D B " " " " " " " " " " " " " " " A " " " " " " " " " " " " " " " GND " " IN GND " " IN GND GND 12 GND GND " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " GND " " " GND " " " " " Meas. terminal Test limits Min Max Unit B A B A B A B A B A B A B A 3/ MIL-M-38510/14E 27 Repeat subgroup 7 at TC = 125C and TC = -55C. 3003 122 tPHL1 " " " tPLH1 " " " tPHL2 tPLH2 (Fig 4) " " " " " " " " 123 124 125 126 127 128 129 130 131 5.0 V 5.0 V 5.0 V 5.0 V 5.0 V GND " " " A to W B to W C to W D to W A to W B to W C to W D to W G to W G to W 8 " " " 8 " " " 6 6 37 " " " 39 " " " 34 28 ns " " " ns " " " ns ns 5.0 V GND " " " 5.0 V 5.0 V " " " " TABLE III. Group A inspection for device type 01 - Continued. Terminal conditions (pins not designated may be H 2.0 V, or L 0.8 V, or open). Subgroup 7 TC = 25C " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " 8 9 TC = 25C " " " " " " " " Symbol Truth table test " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " MILSTD-883 method 3014 " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " Cases J, K, Z Test No. 89 90 91 92 93 94 95 96 97 98 99 100 101 102 103 104 105 106 107 108 109 110 111 112 113 114 115 116 117 118 119 120 121 13 C B " " " " " " " A " " " " " " " B " " " " " " " A " " " " " " " 14 B B " " " A " " " B " " " A " " " B " " " A " " " B " " " A " " " GND IN GND GND GND IN GND GND GND GND 15 A B B A A B B A A B B A A B B A A B B A A B B A A B B A A B B A A IN GND " " IN GND " " GND GND 5.0 V 16 17 18 19 20 21 22 23 24 E15 E14 E13 E12 E11 E10 E9 E8 VCC 4.5 V " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " 5.0 V " " " 5.0 V " " " " " Meas. terminal Test limits Min Max Unit MIL-M-38510/14E 3/ B A B A B A B A B A B A B A B A 28 Repeat subgroup 7 at TC = 125C and TC = -55C. 3003 122 GND tPHL1 " " " tPLH1 " " " tPHL2 tPLH2 (Fig 4) " " " " " " " " 123 124 125 126 127 128 129 130 131 GND IN GND GND GND IN GND GND GND A to W B to W C to W D to W A to W B to W C to W D to W G to W G to W 8 " " " 8 " " " 6 6 37 " " " 39 " " " 34 28 ns " " " ns " " " ns ns 5.0 V See note at end of device type 01 TABLE III. Group A inspection for device type 01 - Continued. Terminal conditions (pins not designated may be H 2.0 V, or L 0.8 V, or open). Subgroup 9 TC = 25C " " " " " " " " " " " " " " " " Symbol tPHL3 " " " " " " " " " " " " " " " tPLH3 " " " " " " " " " " " " " " " tPHL1 " " " tPLH1 " " " tPHL2 tPLH2 MILSTD-883 method 3003 (Fig 4) " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " Cases J, K, Z Test No. 132 133 134 135 136 137 138 139 140 141 142 143 144 145 146 147 148 149 150 151 152 153 154 155 156 157 158 159 160 161 162 163 164 165 166 167 168 169 170 171 172 173 1 E7 2 E6 3 E5 4 E4 5 E3 6 E2 7 E1 IN 8 E0 IN 9 G GND " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " GND " " " " " " " IN IN 10 W OUT " " " " " " " " " " " " " " " OUT " " " " " " " " " " " " " " " OUT " " " " " " " OUT OUT 11 D GND " " " " " " " 5.0 V " " " " " " " GND " " " " " " " 5.0 V " " " " " " " GND " " IN GND " " IN GND GND 12 GND GND " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " Meas. terminal to W E1 to W E2 to W E3 to W E4 to W E5 to W E6 to W E7 to W E8 to W E9 to W E10 to W E11 to W E12 to W E13 to W E14 to W E15 to W E0 Test limits Min 3 " " " " " " " " " " " " " " " 3 " " " " " " " " " " " " " " " 8 " " " " " " " 6 6 Max 18 " " " " " " " " " " " " " " " 24 " " " " " " " " " " " " " " " 40 " " " 43 " " " 37 32 Unit ns " " " " " " " " " " " " " " " ns " " " " " " " " " " " " " " " ns " " " " " " " ns ns IN IN IN IN IN IN MIL-M-38510/14E IN IN IN IN IN IN IN IN " " " " " " " " " " " " " " 10 TC = 125C " " " " " " " " 5.0 V 5.0 V 5.0 V GND " " " " " " " 5.0 V 5.0 V to W E1 to W E2 to W E3 to W E4 to W E5 to W E6 to W E7 to W E8 to W E9 to W E10 to W E11 to W E12 to W E13 to W E14 to W E15 to W A to W E0 29 B to W C to W D to W A to W B to W C to W D to W G to W G to W 5.0 V 5.0 V TABLE III. Group A inspection for device type 01 - Continued. Terminal conditions (pins not designated may be H 2.0 V, or L 0.8 V, or open). Subgroup 9 TC = 25C " " " " " " " " " " " " " " " " Symbol tPHL3 " " " " " " " " " " " " " " " tPLH3 " " " " " " " " " " " " " " " tPHL1 " " " tPLH1 " " " tPHL2 tPLH2 MILSTD-883 method 3003 (Fig 4) " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " Cases J, K, Z Test No. 132 133 134 135 136 137 138 139 140 141 142 143 144 145 146 147 148 149 150 151 152 153 154 155 156 157 158 159 160 161 162 163 164 165 166 167 168 169 170 171 172 173 13 C GND " " " 5.0 V " " " GND " " " 5.0 V " " " GND " " " 5.0 V " " " GND " " " 5.0 V " " " GND GND IN GND GND GND IN GND GND GND 14 B GND GND 5.0 V 5.0 V GND GND 5.0 V 5.0 V GND GND 5.0 V 5.0 V GND GND 5.0 V 5.0 V GND GND 5.0 V 5.0 V GND GND 5.0 V 5.0 V GND GND 5.0 V 5.0 V GND GND 5.0 V 5.0 V GND IN GND GND GND IN GND GND GND GND 15 A GND 5.0 V GND 5.0 V GND 5.0 V GND 5.0 V GND 5.0 V GND 5.0 V GND 5.0 V GND 5.0 V GND 5.0 V GND 5.0 V GND 5.0 V GND 5.0 V GND 5.0 V GND 5.0 V GND 5.0 V GND 5.0 V IN GND GND GND IN GND GND GND GND GND 16 17 18 19 20 21 22 23 24 E15 E14 E13 E12 E11 E10 E9 E8 VCC 5.0 V " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " Meas. terminal to W E1 to W E2 to W E3 to W E4 to W E5 to W E6 to W E7 to W E8 to W E9 to W E10 to W E11 to W E12 to W E13 to W E14 to W E15 to W E0 Test limits Min 3 " " " " " " " " " " " " " " " 3 " " " " " " " " " " " " " " " 8 " " " " " " " 6 6 Max 18 " " " " " " " " " " " " " " " 24 " " " " " " " " " " " " " " " 40 " " " 43 " " " 37 32 Unit ns " " " " " " " " " " " " " " " ns " " " " " " " " " " " " " " " ns " " " " " " " ns ns IN IN IN IN IN IN IN IN MIL-M-38510/14E " " " " " " " " " " " " " " 10 TC = 125C " " " " " " " " IN IN IN IN IN IN IN IN to W to W E2 to W E3 to W E4 to W E5 to W E6 to W E7 to W E8 to W E9 to W E10 to W E11 to W E12 to W E13 to W E14 to W E15 to W A to W E0 E1 30 5.0 V B to W C to W D to W A to W B to W C to W D to W G to W G to W 5.0 V See note at end of device type 01 TABLE III. Group A inspection for device type 01 - Continued. Terminal conditions (pins not designated may be H 2.0 V, or L 0.8 V, or open). Subgroup 10 TC = 125C " " " " " " " " " " " " " " " " Symbol tPHL3 " " " " " " " " " " " " " " " tPLH3 " " " " " " " " " " " " " " " MILSTD-883 method 3003 (Fig 4) " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " Cases J, K, Z Test No. 174 175 176 177 178 179 180 181 182 183 184 185 186 187 188 189 190 191 192 193 194 195 196 197 198 199 200 201 202 203 204 205 1 E7 2 E6 3 E5 4 E4 5 E3 6 E2 7 E1 IN 8 E0 IN 9 G GND " " " " " " " " " " " " " " " 10 W OUT " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " 11 D GND " " " " " " " 5.0 V " " " " " " " GND " " " " " " " 5.0 V " " " " " " " 12 GND GND " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " Meas. terminal E0 E1 Test limits Min 3 " " " " " " " " " " " " " " " 3 " " " " " " " " " " " " " " " Max 23 " " " " " " " " " " " " " " " 30 " " " " " " " " " " " " " " " Unit ns " " " " " " " " " " " " " " " ns " " " " " " " " " " " " " " " to W IN IN IN IN IN IN to W E2 to W E3 to W E4 to W E5 to W E6 to W E7 to W E8 to W E9 to W E10 to W E11 to W E12 to W E13 to W E14 to W E15 to W E0 E1 MIL-M-38510/14E IN IN IN IN IN IN IN IN " " " " " " " " " " " " " " " " to W " " " " " " " " " " " " " " 11 to W E2 to W E3 to W E4 to W to W to W E7 to W E8 to W E9 to W E10 to W E11 to W E12 to W E13 to W E14 to W E15 to W E5 E6 31 Same tests, terminal conditions and limits as subgroup 10 except TC = -55C. TABLE III. Group A inspection for device type 01 - Continued. Terminal conditions (pins not designated may be H 2.0 V, or L 0.8 V, or open). Subgroup 10 TC = 125C " " " " " " " " " " " " " " " " Symbol tPHL3 " " " " " " " " " " " " " " " tPLH3 " " " " " " " " " " " " " " " MILSTD-883 method 3003 (Fig 4) " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " Cases J, K, Z Test No. 174 175 176 177 178 179 180 181 182 183 184 185 186 187 188 189 190 191 192 193 194 195 196 197 198 199 200 201 202 203 204 205 13 C GND " " " 5.0 V " " " GND " " " 5.0 V " " " GND " " " 5.0 V " " " GND " " " 5.0 V " " " 14 B GND GND 5.0 V 5.0 V GND GND 5.0 V 5.0 V GND GND 5.0 V 5.0 V GND GND 5.0 V 5.0 V GND GND 5.0 V 5.0 V GND GND 5.0 V 5.0 V GND GND 5.0 V 5.0 V GND GND 5.0 V 5.0 V 15 A GND 5.0 V GND 5.0 V GND 5.0 V GND 5.0 V GND 5.0 V GND 5.0 V GND 5.0 V GND 5.0 V GND 5.0 V GND 5.0 V GND 5.0 V GND 5.0 V GND 5.0 V GND 5.0 V GND 5.0 V GND 5.0 V 16 17 18 19 20 21 22 23 24 E15 E14 E13 E12 E11 E10 E9 E8 VCC 5.0 V " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " Meas. terminal E0 E1 Test limits Min 3 " " " " " " " " " " " " " " " 3 " " " " " " " " " " " " " " " Max 23 " " " " " " " " " " " " " " " 30 " " " " " " " " " " " " " " " Unit ns " " " " " " " " " " " " " " " ns " " " " " " " " " " " " " " " to W IN IN IN IN IN IN IN IN to W E2 to W E3 to W E4 to W E5 to W E6 to W E7 to W E8 to W E9 to W E10 to W E11 to W E12 to W E13 to W E14 to W E15 to W E0 E1 MIL-M-38510/14E MIL-M-38510/14E to W " " " " " " " " " " " " " " 11 to W E2 to W E3 to W E4 to W to W to W E7 to W E8 to W E9 to W E10 to W E11 to W E12 to W E13 to W E14 to W E15 to W E5 E6 IN IN IN IN IN IN IN IN 32 Same tests, terminal conditions and limits as subgroup 10 except TC = -55C. 1/ IIL minimum limit for CKT E is -0.6 mA. 2/ A = 3.0 V minimum, B = 0.0 V or GND. 3/ H > 1.5 V; L < 1.5 V. Only attributes data is required for subgroups 7 and 8. TABLE III. Group A inspection for device type 02. Terminal conditions (pins not designated may be H 2.0 V, or L 0.8 V, or open). MILCases E, F Subgroup Symbol STD-883 Test No. method 1 TC = 25C " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " VOH VOH VOL VOL VIC " " " " " " " " " " " IIL " " " " " " " " " " " IIH1 " " " " " " " " " " " 3009 " " " " " " " " " " " 3010 " " " " " " " " " " " 3006 3006 3007 3007 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 32 33 34 35 36 37 38 39 40 1 D0 2.0 V 2 D1 3 D2 4 D3 5 D4 6 D5 7 D6 8 GND 9 D7 10 G 0.8 V 2.0 V 2.0 V 0.8 V 11 A 0.8 V 2.0 V 2.0 V 0.8 V 12 B 0.8 V 2.0 V 2.0 V 0.8 V Meas. terminal Min 0.8 V -0.8 mA 4.5 V Y 2.4 2.0 V -0.8 mA " W 2.4 2.0 V 16 mA " Y 0.8 V 16 mA " W " D0 " D1 " D2 " D3 " D4 " D5 " D6 " D7 " G " A " B -12 mA " C 5.5 V 5.5 V G -0.7 " " A " " " B " 0.4 V " C " GND " " D0 " " " D1 " " " D2 " " " D3 5.5 V " " D4 " " " D5 " " " D6 " " " D7 GND " G GND " A GND " B 2.4 V " C 5.5 V " D0 " " D1 " " D2 " " D3 GND " D4 " " D5 " " D6 " " D7 C W Y VCC 13 14 15 16 Test limits Max Unit V " " " " " " " " " " " " " " " mA " " " " " " " " " " " A " " " " " " " " " " " 2.0 V -12 mA 0.4 V 2.4 V GND " " " " -12 mA " -12 mA " -12 mA " -12 mA " -12 mA " -12 mA " " -12 mA " " " " " " " " " 0.4 V " 0.4 V " 0.4 V " 0.4 V " 0.4 V " 0.4 V " " 0.4 V " " " " " 2.4 V " 2.4 V " 2.4 V " 2.4 V " 2.4 V " 2.4 V " " 2.4 V -12 mA -12 mA -12 mA 0.4 V GND " " " " " " " " " " 2.4 V 5.5 V " " " " " " " " " " 5.5 V 0.4 V 5.5 V 5.5 V GND 5.5 V GND 5.5 V GND 5.5 V GND 5.5 V GND 2.4 V GND GND 5.5 V GND 5.5 V GND 5.5 V GND 5.5 V GND 5.5 V 5.5 V 0.4 V 5.5 V GND GND 5.5 V 5.5 V GND GND 5.5 V 5.5 V GND GND 2.4 V GND 5.5 V 5.5 V GND GND 5.5 V 5.5 V GND GND 0.4 0.4 -1.5 " " " " " " " " " " " -1.6 " " " " " " " " " " " 40 " " " " " " " " " " " MIL-M-38510/14E 33 See note at end of device type 02. TABLE III. Group A inspection for device type 02- Continued. Terminal conditions (pins not designated may be H 2.0 V, or L 0.8 V, or open). Subgroup MILCases E, F Symbol STD-883 Test No. method IIH2 " " " " " " " " " " " IOS IOS ICC 3010 " " " " " " " " " " " 3011 3011 3005 41 42 43 44 45 46 47 48 49 50 51 52 53 54 55 1 D0 2 D1 3 D2 4 D3 5 D4 6 D5 7 D6 8 GND GND " " " " " " " " " " " " " " 9 D7 10 G 5.5 V GND " " " " " " " " " " 5.5 V GND GND 11 A GND 5.5 V GND GND 5.5 V GND 5.5 V GND 5.5 V GND 5.5 V GND " " " 12 B GND GND 5.5 V GND 5.5 V 5.5 V GND GND 5.5 V 5.5 V GND " " " " 13 C GND " " 5.5 V " " " " GND " " " " " " GND GND 14 W 15 Y Meas. terminal Min 5.5 V G " A " B " C " D0 " D1 " D2 " D3 " D4 " D5 " D6 " D7 VCC " " " Y W VCC -20 -20 16 Test limits Max 100 " " " " " " " " " " " -120 -120 48 Unit A " " " " " " " " " " " mA mA mA 1 TC = 25C " " " " " " " " " " " " " 2 5.5 V 5.5 V 5.5 V 5.5 V 5.5 V 5.5 V 5.5 V GND 5.5 V 5.5 V GND " " GND " " GND " " GND " " GND " " GND " " 5.5 V GND " " MIL-M-38510/14E Same tests, terminal conditions and limits as subgroup 1, except TC = 125C and VIC tests are omitted. Same tests, terminal conditions and limits as subgroup 1, except TC = -55C and VIC tests are omitted. Truth table test " " " " " " " " " " " " " " 56 57 58 59 60 61 62 63 64 65 66 67 68 69 70 71 72 B A B A B A B A B A B A B A GND " " " " " " " " " " " " " " " " B A A 1/ B " " " " " " " " " " " " " " " B B A A B B A A B B A A B B A A B " " " A " " " B " " " A " " " B " " " " " " " A " " " " " " " H 2/ H L H L H L H L H L H L H L H L L L H L H L H L H L H L H L H L H 4.5 V " " " " " " " " " " " " " " " " 2/ 34 3 7 TC = 25C " " " " " " " " " " " " " " " 8 Repeat subgroup 7 at TC = 125C and TC = -55C. See note at end of device type 02. TABLE III. Group A inspection for device type 02- Continued. Terminal conditions (pins not designated may be H 2.0 V, or L 0.8 V, or open). MILCases E, F Subgroup Symbol STD-883 Test No. method 9 TC = 25C " " " " " " " " " " " " " " tPHL1 " " tPLH1 " " tPHL2 " " tPLH2 " " tPHL3 tPLH3 tPHL4 tPLH4 tPHL5 " " " " " " " tPLH5 " " " " " " " 3003 (Fig 4) " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " 73 74 75 76 77 78 79 80 81 82 83 84 85 86 87 88 89 90 91 92 93 94 95 96 97 98 99 100 101 102 103 104 IN IN IN IN IN IN IN 1 D0 GND " " " " " " " " " " " 5.0 V " " " IN IN IN IN IN IN IN 5.0 V 5.0 V 5.0 V 5.0 V 5.0 V 5.0 V 5.0 V 5.0 V 5.0 V 2 D1 5.0 V 5.0 V 5.0 V 3 D2 4 D3 5 D4 6 D5 7 D6 8 GND GND " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " IN 9 D7 10 G GND " " " " " " " " " " " IN " " " GND " " " " " " " " " " " " " " " 11 A IN GND GND IN GND GND IN GND GND IN GND GND GND " " " GND 5.0 V GND 5.0 V GND 5.0 V GND 5.0 V GND 5.0 V GND 5.0 V GND 5.0 V GND 5.0 V 12 B GND IN GND GND IN GND GND IN GND GND IN GND GND " " " GND GND 5.0 V 5.0 V GND GND 5.0 V 5.0 V GND GND 5.0 V 5.0 V GND GND 5.0 V 5.0 V 13 C GND GND IN GND GND IN GND GND IN GND GND IN GND " " " GND " " " 5.0 V " " " GND " " " 5.0 V " " " OUT " " " " " " " " " " " " " " " OUT OUT OUT OUT 14 W OUT " " " " " OUT " " " " " 15 Y 16 VCC 5.0 V " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " Meas. terminal Min A to W B to W C to W A to W B to W C to W A to Y B to Y C to Y A to Y B to Y C to Y G to W G to W G to Y G to Y Do to W D1 to W D2 to W D3 to W D4 to W D5 to W D6 to W D7 to W Do to W D1 to W D2 to W D3 to W D4 to W D5 to W D6 to W D7 to W 6 " " " " " " " " " " " 6 6 8 8 3 " " " " " " " " " " " " " " " Test limits Max 32 " " 29 " " 40 " " 39 " " 28 24 37 35 20 " " " " " " " 17 " " " " " " " Unit ns " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " MIL-M-38510/14E 35 " " " " " " " " " " " " " " " " IN See note at end of device type 02. TABLE III. Group A inspection for device type 02- Continued. Terminal conditions (pins not designated may be H 2.0 V, or L 0.8 V, or open). Subgroup MILCases E, F Symbol STD-883 Test No. method tPHL6 " " " " " " " tPLH6 " " " " " " " tPHL1 " " tPLH1 " " tPHL2 " " tPLH2 " " tPHL3 tPLH3 tPHL4 tPLH4 tPHL5 " " " " " " " 3003 (Fig 4) " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " 105 106 107 108 109 110 111 112 113 114 115 116 117 118 119 120 121 122 123 124 125 126 127 128 129 130 131 132 133 134 135 136 137 138 139 140 141 142 143 144 1 D0 IN IN IN IN IN IN IN IN IN IN IN IN IN IN GND " " " " " " " " " " " 5.0 V " " " IN 5.0 V 5.0 V 5.0 V 5.0 V 5.0 V 5.0 V 5.0 V 5.0 V 5.0 V 5.0 V 5.0 V 5.0 V 2 D1 3 D2 4 D3 5 D4 6 D5 7 D6 8 GND GND " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " IN 9 D7 10 G GND " " " " " " " " " " " " " " " " " " " " " " " " " " " IN " " " GND " " " " " " " 11 A GND 5.0 V GND 5.0 V GND 5.0 V GND 5.0 V GND 5.0 V GND 5.0 V GND 5.0 V GND 5.0 V IN GND GND IN GND GND IN GND GND IN GND GND GND " " " GND 5.0 V GND 5.0 V GND 5.0 V GND 5.0 V 12 B GND GND 5.0 V 5.0 V GND GND 5.0 V 5.0 V GND GND 5.0 V 5.0 V GND GND 5.0 V 5.0 V GND IN GND GND IN GND GND IN GND GND IN GND GND " " " GND GND 5.0 V 5.0 V GND GND 5.0 V 5.0 V 13 C GND " " " 5.0 V " " " GND " " " 5.0 V " " " GND GND IN GND GND IN GND GND IN GND GND IN GND " " " GND " " " 5.0 V " " " 14 W 15 Y OUT " " " " " " " " " " " " " " " OUT " " " " " OUT " " " " " OUT OUT OUT OUT OUT " " " " " " " Meas. terminal Min 5.0 V Do to Y 6 " " D1 to Y " " D2 to Y " " D3 to Y " " D4 to Y VCC " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " D5 to Y D6 to Y D7 to Y Do to Y D1 to Y D2 to Y D3 to Y D4 to Y D5 to Y D6 to Y D7 to Y A to W B to W C to W A to W B to W C to W A to Y B to Y C to Y A to Y B to Y C to Y G to W G to W G to Y G to Y Do to W D1 to W D2 to W D3 to W D4 to W D5 to W D6 to W D7 to W " " " 6 " " " " " " " 6 " " " " " 8 " " " " " 6 6 8 8 3 " " " " " " " 16 Test limits Max 29 " " " " " " " 29 " " " " " " " 40 " " 38 " " 49 " " 45 " " 37 35 46 42 32 " " " " " " " Unit ns " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " 9 TC = 25C " " " " " " " " " " " " " " 10 TC = 125C " " " " " " " " " " " " " " " " " " " " " " IN MIL-M-38510/14E 36 IN IN IN IN IN IN IN See note at end of device type 02. TABLE III. Group A inspection for device type 02- Continued. Terminal conditions (pins not designated may be H 2.0 V, or L 0.8 V, or open). MILCases E, F Subgroup Symbol STD-883 Test No. method 10 TC = 125C " " " " " " " " " " " " " " " " tPLH5 " " " " " " " tPHL6 " " " " " " " tPLH6 " " " " " " " 3003 (Fig 4) " " " " " " " " " " " " " " " " " " " " " " 145 146 147 148 149 150 151 152 153 154 155 156 157 158 159 160 161 162 163 164 165 166 167 168 IN IN IN IN IN IN IN IN IN IN IN IN IN IN 1 D0 IN IN IN IN IN IN IN 2 D1 3 D2 4 D3 5 D4 6 D5 7 D6 8 GND GND " " " " " " " " " " " " " " " " " " " " " " " 9 D7 10 G GND " " " " " " " " " " " " " " " " " " " " " " " 11 A GND 5.0 V GND 5.0 V GND 5.0 V GND 5.0 V GND 5.0 V GND 5.0 V GND 5.0 V GND 5.0 V GND 5.0 V GND 5.0 V GND 5.0 V GND 5.0 V 12 B GND GND 5.0 V 5.0 V GND GND 5.0 V 5.0 V GND GND 5.0 V 5.0 V GND GND 5.0 V 5.0 V GND GND 5.0 V 5.0 V GND GND 5.0 V 5.0 V 13 C GND " " " 5.0 V " " " GND " " " 5.0 V " " " GND " " " 5.0 V " " " 14 W OUT " " " " " " " OUT " " " " " " " " " " " " " " " 15 Y 16 VCC " " " " " " " " " " " " " " " " " " " " " " " Meas. terminal Min 3 " " " " " " " 6 " " " " " " " " " " " " " " " D1 to W D2 to W D3 to W D4 to W D5 to W D6 to W D7 to W Do to Y D1 to Y D2 to Y D3 to Y D4 to Y D5 to Y D6 to Y D7 to Y Do to Y D1 to Y D2 to Y D3 to Y D4 to Y D5 to Y D6 to Y D7 to Y Test limits Max 26 " " " " " " " 41 " " " " " " " 33 " " " " " " " Unit ns " " " " " " " " " 5.0 V Do to W IN MIL-M-38510/14E IN " " " " " " " " " " " " " " 37 " " " " " " 11 IN Same tests, terminal conditions and limits as subgroup 10, except TA = -55C. 1/ A = 3.0 V minimum, B = 0.0 V or GND. 2/ H > 1.5 V; L < 1.5 V. Only attributes data is required for subgroups 7 and 8. TABLE III. Group A inspection for device type 03. Terminal conditions (pins not designated may be H 2.0 V, or L 0.8 V, or open). MILCases E, F Subgroup Symbol STD-883 Test No. method 1 TC = 25C " " " " " " " " " " " " " " " " " " " VOH VOH VOL VOL VIC " " " " " " " " " " " IIL " " " " " " " " " " " IIH1 " " " " " " " " " " " 3009 " " " " " " " " " " " 3010 " " " " " " " " " " " 3006 3006 3007 3007 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 32 33 34 35 36 37 38 39 40 1 1G 0.8 V 2.0 V 2 B 0.8 V 0.8 V 3 1C3 4 1C2 5 1C1 6 1C0 7 1Y 8 GND GND " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " 9 2Y 10 2C0 11 2C1 12 2C2 13 2C3 14 A 0.8 V 0.8 V 15 2G 0.8 V 2.0 V -12 mA Meas. terminal Min 4.5 V 1Y 2.4 " 2Y 2.4 " 1Y " 2Y " A " B " 1C0 " 1C1 " 1C2 " 1C3 " 1G " 2C0 " 2C1 " 2C2 " 2C3 " 2G 5.5 V A -0.7 " B " " 1G " " 2G " " " 1C0 " " 1C1 " " 1C2 " " 1C3 " " 2C0 " " 2C1 " " 2C2 " " 2C3 " A " B " 1G " 2G " 1C0 " 1C1 " 1C2 " 1C3 " 2C0 " 2C1 " 2C2 " 2C3 VCC 16 Test limits Max Unit V " " " " " " " " " " " " 2.0 V -.8 mA 16 mA -.8 mA 2.0 V 16 mA -12 mA -12 mA -12 mA -12 mA -12 mA -12mA -12 mA -12 mA -12 mA -12 mA -12 mA 0.4 V 0.4 V 0.4 V GND " " " GND GND 5.5 V 5.5 V GND GND 5.5 V 5.5 V 2.4 V 2.4 V 5.5 V " " " 5.5 V 5.5 V GND GND 5.5 V 5.5 V GND GND 2.4 V 2.4 V 2.4 V 2.4 V 0.4 V 0.4 V 0.4 V 0.4 V 0.4 V GND 5.5 V GND 5.5 V GND 5.5 V GND 5.5 V 2.4 V " " " " " " " " " " " " " " " " " " " 0.4 V 0.4 V 0.4 V 0.4 V GND " " " 2.4 V 5.5 V GND 5.5 V GND 5.5 V GND 5.5 V GND 2.4 V 2.4 V 2.4 V 2.4 V 5.5 V " " " 0.4 0.4 -1.5 " " " " " " " " " " " -1.6 " " " " " " " " " " " 40 " " " " " " " " " " " MIL-M-38510/14E " " " mA " " " " " " " " " " " A " " " " " " " " " " " 38 See notes at end of device type 03. TABLE III. Group A inspection for device type 03 - Continued. Terminal conditions (pins not designated may be H 2.0 V, or L 0.8 V, or open). MILCases E, F Subgroup Symbol STD-883 Test No. method 1 3010 " " " " " " " " " " " 3011 3011 3005 41 42 43 44 45 46 47 48 49 50 51 52 53 54 55 1 1G 2 B 3 1C3 4 1C2 5 1C1 6 1C0 7 1Y 8 GND GND " " " " " " " " " " " " " " 9 2Y 10 2C0 11 2C1 12 2C2 13 2C3 14 A 5.5 V 15 2G 16 VCC 5.5 V " " " " " " " " " " " " " " Meas. terminal A B 1G 2G 1C0 1C1 1C2 1C3 2C0 2C1 2C2 2C3 1Y 2Y VCC Test limits Min Max 100 " " " " " " " " " " " -55 -55 52 Unit A " " " " " " " " " " " mA mA mA IIH2 " 5.5 V TC = 25C " " 5.5 V " " " " 5.5 V 5.5 V 5.5 V " " " 5.5 V 5.5 V " " " GND 5.5 V " " " GND 5.5 V " " 5.5 V " " 5.5 V " " GND " " " " GND " GND GND GND 5.5 V GND IOS " " GND " IOS " " " GND GND GND GND ICC 2 Same tests, terminal conditions and limits as subgroup 1, except TC = 125C and VIC tests are omitted. 3 Same tests, terminal conditions and limits as subgroup 1, except TC = -55C and VIC tests are omitted. 7 Truth 56 A 1/ L 2/ GND L 57 B B B L " L TC = 25C table " test 58 " B A H " H " " 59 " B B L " L " " 60 " B A H " H " " 61 " A B L " L " " 62 " A A H " H " " 63 " A B L " L " " 64 " A A H " H 8 Repeat subgroup 7 at TC = 125C and TC = -55C. 3003 65 GND GND IN OUT GND 9 tPHL1 " (Fig 5) 66 " GND IN " " TC = 25C " " " 67 " 5.0 V IN " " " " " 68 " 5.0 V IN " " " " " 69 GND " OUT " " " 70 GND " " " " " 71 5.0 V " " " " " 72 5.0 V " " 5.5 V 5.5 V GND 5.5 V GND 5.5 V GND 5.5 V GND " " " 5.5 V 5.5 V 5.5 V 5.5 V 5.5 V GND GND GND GND GND GND GND 5.5 V " " " GND GND -20 -20 MIL-M-38510/14E B A B A B A B A B B A A B B A A GND 5.0 V GND 5.0 V GND 5.0 V GND 5.0 V A B " " " " " " " 4.5 V " " " " " " " " 5.0 V " " " " " " " 1C0 to 1Y 1C1 to 1Y 1C2 to 1Y 1C3 to 1Y 2C0 to 2Y 2C1 to 2Y 2C2 to 2Y 2C3 to 2Y 39 2/ IN IN IN IN GND " " " 3 " " " " " " " 25 " " " " " " " ns " " " " " " " See notes at end of device type 03. TABLE III. Group A inspection for device type 03 - Continued. Terminal conditions (pins not designated may be H 2.0 V, or L 0.8 V, or open). MIL- Cases E, F Subgroup Symbol STD-883 method Test No. 9 TC = 25C " " " " " " " " " " " " " " " " " " 10 tPLH1 " " " " " " " tPHL2 " " " tPLH2 " " " tPHL3 tPHL3 tPLH3 tPLH3 3003 (Fig 5) " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " 73 74 75 76 77 78 79 80 81 82 83 84 85 86 87 88 89 90 91 92 93 94 95 96 97 98 99 100 101 102 103 104 105 106 107 108 1 1G GND " " " 2 B GND GND 5.0 V 5.0 V GND GND 5.0 V 5.0 V GND IN GND IN GND IN GND IN GND GND GND GND GND GND 5.0 V 5.0 V GND GND 5.0 V 5.0 V GND GND 5.0 V 5.0 V GND GND 5.0 V 5.0 V 3 1C3 4 1C2 5 1C1 IN IN IN 6 1C0 IN 7 1Y OUT " " " 8 GND GND " " " " " " " " " " " GND " " " " " " " " " " " " " " " " " " " " " " " 9 2Y 10 2C0 11 2C1 12 2C2 13 2C3 14 A GND 5.0 V GND 5.0 V GND 5.0 V GND 5.0 V IN GND IN GND IN GND IN GND GND GND GND GND GND 5.0 V GND 5.0 V GND 5.0 V GND 5.0 V GND 5.0 V GND 5.0 V GND 5.0 V GND 5.0 V 15 2G 16 VCC 5.0 V " " " " " " " " " " " 5.0 V " " " " " " " " " " " " " " " " " " " " " " " Meas. terminal 1C0 to 1Y 1C1 to 1Y 1C2 to 1Y 1C3 to 1Y 2C0 to 2Y 2C1 to 2Y 2C2 to 2Y 2C3 to 2Y A to 1Y B to 1Y A to 2Y B to 2Y A to 1Y B to 1Y A to 2Y B to 2Y 1G to 1Y 2G to 2Y 1G to 1Y 2G to 2Y 1C0 to 1Y 1C1 to 1Y 1C2 to 1Y 1C3 to 1Y 2C0 to 2Y 2C1 to 2Y 2C2 to 2Y 2C3 to 2Y 1C0 to 1Y 1C1 to 1Y 1C2 to 1Y 1C3 to 1Y 2C0 to 2Y 2C1 to 2Y 2C2 to 2Y 2C3 to 2Y Test limits Min 3 " " " " " " " 6 " " " 6 " " " " " " " 3 " " " " " " " " " " " " " " " Max 24 " " " " " " " 36 " " " 34 " " " 28 28 38 38 29 " " " " " " " 28 " " " " " " " Unit ns " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " OUT " " " IN IN IN IN GND " " " GND GND 5.0 V 5.0 V GND GND OUT OUT OUT OUT GND GND 5.0 V 5.0 V GND GND GND GND 5.0 V 5.0 V GND GND OUT OUT OUT OUT OUT OUT GND GND 5.0 V 5.0 V 5.0 V 5.0 V GND GND IN IN IN IN GND " " " 5.0 V 5.0 V IN IN IN IN OUT OUT OUT " " " MIL-M-38510/14E tPHL1 " TC = 125C " " " " " " " " " " " " " tPLH1 " " " " " " " " " " " " " " 40 OUT " " " IN IN IN IN GND " " " GND " " " IN IN IN IN OUT " " " OUT " " " IN IN IN IN GND " " " See notes at end of device type 03. TABLE III. Group A inspection for device type 03 - Continued. Terminal conditions (pins not designated may be H 2.0 V, or L 0.8 V, or open). MIL- Cases E, F Subgroup Symbol STD-883 method Test No. 10 TC = 125C " " " " " " " " " " 11 tPHL2 " " " tPLH2 " " " tPHL3 tPHL3 tPLH3 tPLH3 3003 (Fig 5) " " " " " " " " " " 109 110 111 112 113 114 115 116 117 118 119 120 1 1G GND GND 2 B GND IN GND IN GND IN GND IN GND GND GND GND 3 1C3 4 1C2 5.0 V 5 1C1 5.0 V 6 1C0 GND GND 7 1Y OUT OUT 8 GND GND " " " " " " " " " " " 9 2Y 10 2C0 11 2C1 12 2C2 13 2C3 14 A IN GND IN GND IN GND IN GND GND GND GND GND 15 2G Meas. terminal 5.0 V A to 1Y " B to 1Y " A to 2Y " B to 2Y " A to 1Y " B to 1Y " A to 2Y " B to 2Y " 1G to 1Y " 2G to 2Y " 1G to 1Y " 2G to 2Y VCC 16 Test limits Min 6 " " " " " " " " " " " Max 44 " " " 42 " " " 32 32 42 42 Unit ns " " " " " " " " " " " OUT OUT GND GND 5.0 V 5.0 V GND GND GND GND 5.0 V 5.0 V GND GND OUT OUT OUT OUT OUT OUT GND GND 5.0 V 5.0 V 5.0 V 5.0 V GND GND IN IN IN IN 5.0 V 5.0 V OUT OUT Same tests, terminal conditions and limits as subgroup 10, except TC = -55C. 1/ A = 3.0 V minimum, B = 0.0 V or GND. 2/ H > 1.5 V; L < 1.5 V. Only attributes data is required for subgroups 7 and 8. MIL-M-38510/14E 41 TABLE III. Group A inspection for device type 04. Terminal conditions (pins not designated may be H 2.0 V, or L 0.8 V, or open). MIL- Cases E, F Subgroup Symbol STD-883 method Test No. 1 TC = 25C " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " VOH " " " VOL " " " VIC " " " " " " " " " IIL " " " " " " " " " IIH1 " " " " " " " " " 3009 " " " " " " " " " 3010 " " " " " " " " " 3006 " " " 3007 " " " 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 32 33 34 35 36 37 38 1 2Y 2 2W 3 B 4 2C0 5 2C1 6 2C2 7 2C3 8 GND 9 1C3 10 1C2 11 1C1 12 1C0 2.0 V 0.8 V 13 A 14 1W 15 1Y 16 VCC Meas. terminal 1Y 1W 2Y 2W 1W 1Y 2W 2Y A B 1C0 1C1 1C2 1C3 2C0 2C1 2C2 2C3 A B 1C0 1C1 1C2 1C3 2C0 2C1 2C2 2C3 A B 1C0 1C1 1C2 1C3 2C0 2C1 2C2 2C3 Test limits Min 2.4 " " " 0.4 " " " -1.5 " " " " " " " " " -1.6 " " " " " " " " " 40 " " " " " " " " " Max Unit V " " " " " " " " " " " " " " " " " mA " " " " " " " " " A " " " " " " " " " 0.8 V " -0.8 mA " -0.8 mA " " " 16 mA " 16 mA " GND " 2.0 V " 0.8 V " " " 2.0 V " 0.8 V " " -12 mA " " " -12 mA " -12 mA " -12 mA -12 mA " -12 mA " -12 mA " -12 mA " " 0.4 V " GND " GND " 0.4 V 5.5 V " 0.4 V 5.5 V " 0.4 V GND 0.4 V " GND 0.4 V " 5.5 V 0.4 V " 5.5 V 0.4 V " " 2.4 V " 5.5 V " 5.5 V " 2.4 V GND " 2.4 V GND " 2.4 V 5.5 V 2.4 V " 5.5 V 2.4 V " GND 2.4 V " GND 2.4 V " 0.8 V -0.8 mA 4.5 V " -0.8 mA " " " " " 2.0 V " 16 mA " 0.8 V " 16 mA " " " " " -12 mA " " -12 mA " " " " " " " " 0.4 V 5.5 V " 0.4 V GND " 5.5 V " GND " 5.5 V " GND " 5.5 V " GND " 5.5 V " 2.4 V " " 2.4 V 5.5 V " GND " 5.5 V " GND " 5.5 V " GND " 5.5 V " GND " MIL-M-38510/14E -0.7 " " " " " " " " " 42 See note at end of device type 04. TABLE III. Group A inspection for device type 04 - Continued. Terminal conditions (pins not designated may be H 2.0 V, or L 0.8 V, or open). MILSubgroup Symbol STD-883 method 1 TC = 25C " " " " " " " " " " " " " 2 3 7 IIH2 " " " " " " " " " IOS " " " 3010 " " " " " " " " " 3011 " " " 3005 Cases E, F Test No. 39 40 41 42 43 44 45 46 47 48 49 50 51 52 53 1 2Y 2 2W 3 B 5.5 V " " GND GND 5.5 V 5.5 V GND " " " " " " 4 2C0 5 2C1 6 2C2 7 2C3 8 GND GND " " " " " " " " " " " " " " 9 1C3 10 1C2 11 1C1 12 1C0 13 A 5.5 V 5.5 V 5.5 V GND 5.5 V GND 5.5 V GND 5.5 V GND GND GND " GND 5.5 V " " " GND 5.5 V " 14 1W 15 1Y 16 VCC 5.5 V " " " " " " " " " " " " " " Meas. terminal A B 1C0 1C1 1C2 1C3 2C0 2C1 2C2 2C3 1W 1Y 2W 2Y VCC Min Test limits Max 100 " " " " " " " " " -120 " " " 45 Unit ns " " " " " " " " " mA " " " " 5.5 V 5.5 V 5.5 V 5.5 V 5.5 V 5.5 V 5.5 V GND GND GND GND GND GND GND GND GND GND ICC Same tests, terminal conditions and limits as subgroup 1, except TC = 125C and VIC tests are omitted. Same tests, terminal conditions and limits as subgroup 1, except TC = -55C and VIC tests are omitted. Truth 54 L 2/ H B 1/ B GND 55 56 57 58 59 60 61 3003 (Fig 5) " " " " " " 62 63 64 65 66 67 68 69 OUT " " " H L H L H L H L H L H L H L " " " A " " " GND GND 5.0 V 5.0 V GND GND 5.0 V 5.0 V IN IN IN IN A B A B A B A " " " " " " " GND " " " " " " " IN IN B A B A GND 5.5 V 5.5 V GND " " GND " " GND " " -20 " " " MIL-M-38510/14E B A B A B B A A B B A A H L H L H L H L L H L H L H L H OUT " " " 4.5 V " " " " " " " 5.0 V " " " " " " " 3 " " " " " " " 29 " " " " " " " ns " " " " " " " 2/ TC = 25C table " test " " " " " 8 9 " " " " " 43 Repeat subgroup 7 at TC = 125C and TC = -55C. IN IN GND 5.0 V GND 5.0 V GND 5.0 V GND 5.0 V 1C0 to 1Y 1C1 to 1Y 1C2 to 1Y 1C3 to 1Y 2C0 to 2Y 2C1 to 2Y 2C2 to 2Y 2C3 to 2Y tPHL1 " TC = 25C " " " " " " " " " " " " See note at end of device type 04. TABLE III. Group A inspection for device type 04 - Continued. Terminal conditions (pins not designated may be H 2.0 V, or L 0.8 V, or open). MIL- Cases E, F Subgroup Symbol STD-883 method Test No. 9 TC = 25C " " " " " " " " " " " " " " " " " tPLH1 " " " " " " " tPHL2 " " " " " " " tPLH2 " " " " " " " tPHL3 " " " tPLH3 " " " tPHL4 " " " 3003 (Fig 5) " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " 70 71 72 73 74 75 76 77 78 79 80 81 82 83 84 85 86 87 88 89 90 91 92 93 94 95 96 97 98 99 100 101 102 103 104 105 OUT OUT OUT OUT OUT OUT OUT " " " OUT " " " OUT " " " 1 2Y 2 2W 3 B GND GND 5.0 V 5.0 V GND GND 5.0 V 5.0 V GND GND 5.0 V 5.0 V GND GND 5.0 V 5.0 V GND GND 5.0 V 5.0 V GND GND 5.0 V 5.0 V GND GND IN IN GND GND IN IN GND GND IN IN GND 5.0 V GND 5.0 V GND 5.0 V GND 5.0 V GND 5.0 V GND 5.0 V IN IN IN IN IN IN IN IN IN IN IN IN 4 2C0 5 2C1 6 2C2 7 2C3 8 GND GND " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " 5.0 V GND 5.0 V GND 5.0 V GND 5.0 V GND 5.0 V GND 5.0 V GND IN IN IN IN IN IN IN IN IN IN IN 9 1C3 10 1C2 11 1C1 12 1C0 IN 13 A GND 5.0 V GND 5.0 V GND 5.0 V GND 5.0 V GND 5.0 V GND 5.0 V GND 5.0 V GND 5.0 V GND 5.0 V GND 5.0 V GND 5.0 V GND 5.0 V IN IN GND GND IN IN GND GND IN IN GND GND OUT OUT OUT OUT OUT OUT OUT " " " OUT " " " 14 1W 15 1Y 16 VCC Meas. terminal Test limits Min 3 " " " " " " " " " " " " " " " " " " " " " " " 6 " " " " " " " " " " " Max 29 " " " " " " " 18 " " " " " " " 17 " " " " " " " 37 " " " 37 " " " 28 " " " Unit ns " " " " " " " " " " " " " " " " " " " " " " " ns " " " " " " " " " " " OUT 5.0 V 1C0 to 1Y " " 1C1 to 1Y " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " 1C2 to 1Y 1C3 to 1Y 2C0 to 2Y 2C1 to 2Y 2C2 to 2Y 2C3 to 2Y 1C0 to 1W 1C1 to 1W 1C2 to 1W 1C3 to 1W 2C0 to 2W 2C1 to 2W 2C2 to 2W 2C3 to 2W 1C0 to 1W 1C1 to 1W 1C2 to 1W 1C3 to 1W 2C0 to 2W 2C1 to 2W 2C2 to 2W 2C3 to 2W A to 1Y A to 2Y B to 1Y B to 2Y A to 1Y A to 2Y B to 1Y B to 2Y A to 1W A to 2W B to 1W B to 2W MIL-M-38510/14E 44 " " " " " " " " " " " " " " " " " See note at end of device type 04. TABLE III. Group A inspection for device type 04 - Continued. Terminal conditions (pins not designated may be H 2.0 V, or L 0.8 V, or open). MILCases E, F Subgroup Symbol STD-883 method Test No. 9 TC = 25C " " 10 tPLH4 " " " 3003 (Fig 5) " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " 106 107 108 109 110 111 112 113 114 115 116 117 118 119 120 121 122 123 124 125 126 127 128 129 130 131 132 133 134 135 136 137 138 139 140 141 OUT " " " OUT " " " OUT " " " OUT " " " OUT OUT 1 2Y 2 2W 3 B GND GND IN IN GND GND 5.0 V 5.0 V GND GND 5.0 V 5.0 V GND GND 5.0 V 5.0 V GND GND 5.0 V 5.0 V GND GND 5.0 V 5.0 V GND GND 5.0 V 5.0 V GND GND 5.0 V 5.0 V GND GND 5.0 V 5.0 V IN IN IN IN IN IN IN IN IN IN IN IN IN IN IN IN GND 5.0 V GND 5.0 V 4 2C0 5 2C1 6 2C2 7 2C3 8 GND GND " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " IN IN IN IN IN IN IN IN IN IN IN IN IN IN IN IN 5.0 V GND 9 1C3 10 1C2 11 1C1 5.0 V 12 1C0 GND 13 A IN IN GND GND GND 5.0 V GND 5.0 V GND 5.0 V GND 5.0 V GND 5.0 V GND 5.0 V GND 5.0 V GND 5.0 V GND 5.0 V GND 5.0 V GND 5.0 V GND 5.0 V GND 5.0 V GND 5.0 V GND 5.0 V GND 5.0 V OUT " " " OUT " " " OUT " " " OUT " " " OUT 14 1W OUT 15 1Y 16 VCC 5.0 V " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " Meas. terminal A to 1W A to 2W B to 1W B to 2W 1C0 to 1Y 1C1 to 1Y 1C2 to 1Y 1C3 to 1Y 2C0 to 2Y 2C1 to 2Y 2C2 to 2Y 2C3 to 2Y 1C0 to 1Y 1C1 to 1Y 1C2 to 1Y 1C3 to 1Y 2C0 to 2Y 2C1 to 2Y 2C2 to 2Y 2C3 to 2Y 1C0 to 1W 1C1 to 1W 1C2 to 1W 1C3 to 1W 2C0 to 2W 2C1 to 2W 2C2 to 2W 2C3 to 2W 1C0 to 1W 1C1 to 1W 1C2 to 1W 1C3 to 1W 2C0 to 2W 2C1 to 2W 2C2 to 2W 2C3 to 2W Test limits Min 6 " " " 3 " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " Max 26 " " " 41 " " " " " " " 39 " " " " " " " 25 " " " " " " " 24 " " " " " " " Unit ns " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " tPHL1 " TC = 125C " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " tPLH1 " " " " " " " tPHL2 " " " " " " " tPLH2 " " " " " " " 45 MIL-M-38510/14E See note at end of device type 04. TABLE III. Group A inspection for device type 04 - Continued. Terminal conditions (pins not designated may be H 2.0 V, or L 0.8 V, or open). MILCases E, F Subgroup Symbol STD-883 method Test No. 10 TC = 125C " " " " " " " " " " " " " " 11 tPHL3 " " " tPLH3 " " " tPHL4 " " " tPLH4 " " " 3003 (Fig 5) " " " " " " " " " " " " " " 142 143 144 145 146 147 148 149 150 151 152 153 154 155 156 157 OUT OUT OUT OUT OUT OUT OUT OUT 1 2Y 2 2W 3 B GND GND IN IN GND GND IN IN GND GND IN IN GND GND IN IN GND 5.0 V GND 5.0 V GND 5.0 V GND 5.0 V GND 5.0 V GND 5.0 V GND 5.0 V GND 5.0 V 4 2C0 5 2C1 6 2C2 7 2C3 8 GND GND " " " " " " " " " " " " " " " 5.0 V GND 5.0 V GND 5.0 V GND 5.0 V GND 5.0 V GND 5.0 V GND 5.0 V GND 9 1C3 10 1C2 11 1C1 5.0 V 12 1C0 GND 13 A IN IN GND GND IN IN GND GND IN IN GND GND IN IN GND GND OUT OUT OUT OUT OUT OUT OUT 14 1W 15 1Y OUT 16 VCC 5.0 V " " " " " " " " " " " " " " " Meas. terminal A to 1Y A to 2Y B to 1Y B to 2Y A to 1Y A to 2Y B to 1Y B to 2Y A to 1W A to 2W B to 1W B to 2W A to 1W A to 2W B to 1W B to 2W Test limits Min 6 " " " " " " " " " " " " " " " Max 51 " " " " " " " 39 " " " 34 " " " Unit ns " " " " " " " " " " " " " " " MIL-M-38510/14E Same tests, terminal conditions and limits as subgroup 10, except TC = -55C. 1/ A = 3.0 V minimum, B = 0.0 V or GND. 2/ H > 1.5 V; L < 1.5 V. Only attributes data is required for subgroups 7 and 8. 46 TABLE III. Group A inspection for device type 05. Terminal conditions (pins not designated may be H 2.0 V, or L 0.8 V, or open). MIL- Cases E, F Subgroup Symbol STD-883 method Test No. 1 TC = 25C " " " " " " " " " " " " " " " " VOH " " " VOL " " " VIC " " " " " " " " " IIL " " " " " " " " " IIH1 " " " " " " " " " 3009 " " " " " " " " " 3010 " " " " " " " " " 3006 " " " 3007 " " " 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 32 33 34 35 36 37 38 2.4 V 5.5 V GND 5.5 V GND GND 5.5 V GND 5.5 V 2.4 V 2.4 V 2.4 V 2.4 V 0.4 V GND 5.5 V GND 5.5 V 5.5 V GND 5.5 V GND 0.4 V 0.4 V 0.4 V 0.4 V -12 mA -12 mA -12 mA -12 mA -12 mA 1 A 2.0 V " " " 16 mA 16 mA 2 1B0 3 1B1 4 1Y 5 2B0 6 2B1 7 2Y 8 GND GND 2.0 V -.8 mA " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " 2.4 V 2.4 V 2.4 V 2.4 V 0.4 V 0.4 V 0.4 V 0.4 V -12 mA -12 mA -12 mA -12 mA -12 mA 0.4 V GND " " " " " " " " 2.4 V 5.5 V " " " " " " " " 16 mA 16 mA -.8 mA 2.0 V -.8 mA 2.0 V 9 4Y 10 4B1 11 4B0 12 3Y 13 3B1 14 3B0 15 G 0.8 V " " " 2.0 V " " " 16 VCC 4.5 V " " " " " " " " " " " " " " " " " 5.5 V " " " " " " " " " " " " " " " " " " " Meas. terminal 1Y 2Y 3Y 4Y 1Y 2Y 3Y 4Y A 1B0 1B1 2B0 2B1 4B1 4B0 3B1 3B0 G G A 1B0 1B1 2B0 2B1 4B1 4B0 3B1 3B0 G A 1B0 1B1 2B0 2B1 4B1 4B0 3B1 3B0 -0.7 " " " " " " " " " Test limits Min 2.4 " " " 0.4 " " " -1.5 " " " " " " " " " -1.6 " " " " " " " " " 40 " " " " " " " " " Max Unit V " " " " " " " " " " " 2.0 V -.8 mA MIL-M-38510/14E " " " " " " mA " " " " " " " " " A " " " " " " " " " 47 " " " " " " " " " " " " " " " " " " " " See notes at end of device type 05. TABLE III. Group A inspection for device type 05 - Continued. Terminal conditions (pins not designated may be H 2.0 V, or L 0.8 V, or open). MIL- Cases E, F Subgroup Symbol STD-883 method Test No. 1 TC = 25C " " " " " " " " " " " " " 2 3 7 TC = 25C " " " 8 9 TC = 25C " " " " " " IIH2 " " " " " " " " " IOS " " " ICC 3010 " " " " " " " " " 3011 " " " 3005 39 40 41 42 43 44 45 46 47 48 49 50 51 52 53 5.5 V 5.5 V GND 5.5 V GND GND 5.5 V GND 5.5 V 5.5 V " " " GND GND GND GND GND 5.5 V 5.5 V GND 5.5 V 5.5 V GND 5.5 V 5.5 V 5.5 V 5.5 V 1 A 2 1B0 3 1B1 4 1Y 5 2B0 6 2B1 7 2Y 8 GND GND " " " " " " " " " " " " " " GND GND GND 5.5 V 5.5 V GND 5.5 V GND 5.5 V GND 5.5 V 5.5 V 5.5 V 5.5 V 9 4Y 10 4B1 11 4B0 12 3Y 13 3B1 14 3B0 15 G 5.5 V " " " " " " " " " GND " " " GND 16 VCC 5.5 V " " " " " " " " " " " " " " Meas. terminal G A 1B0 1B1 2B0 2B1 4B1 4B0 3B1 3B0 1Y 2Y 4Y 3Y VCC -20 " " " Test limits Min Max 100 " " " " " " " " " -120 " " " 50 Unit A " " " " " " " " " mA " MIL-M-38510/14E " " " Same tests, terminal conditions and limits as subgroup 1, except TC = 125C and VIC tests are omitted. Same tests, terminal conditions and limits as subgroup 1, except TC = -55C and VIC tests are omitted. Truth table test " " 3003 (Fig 6) " " " " " " 54 55 56 57 58 59 60 61 62 63 64 65 66 A 1/ A B B IN " " " " " " " GND 5.0 V OUT GND 5.0 V OUT B A GND 5.0 V B A L 2/ L H L H OUT GND 5.0 V OUT B A B A L L H L H GND " " " " GND " " " " " " " OUT 5.0 V GND OUT 5.0 V GND OUT 5.0 V GND OUT 5.0 V GND L L H L H B A B A L L H L H B A B A A B " " " GND " " " " " " " 4.5 V " " " " 5.0 V " " " " " " " A to 1Y A to 2Y A to 3Y A to 4Y A to 1Y A to 2Y A to 3Y A to 4Y 6 " " " " " " " 30 " " " 27 " " " ns " " " " " " " 2/ 48 Repeat subgroup 7 at TC = 125C and TC = -55C. tPHL1 " " " tPLH1 " " " See notes at end of device type 05. TABLE III. Group A inspection for device type 05 - Continued. Terminal conditions (pins not designated may be H 2.0 V, or L 0.8 V, or open). MIL- Cases E, F Subgroup Symbol STD-883 method Test No. 9 TC = 25C " " " " " " " " " " " " " " " " " " " " " " 10 tPHL2 " " " tPLH2 " " " tPHL3 " " " " " " " tPLH3 " " " " " " " 3003 (Fig 6) " " " " " " " " " " " " " " " " " " " " " " 3003 (Fig 6) " " " " " " " " " " 67 68 69 70 71 72 73 74 75 76 77 78 79 80 81 82 83 84 85 86 87 88 89 90 91 92 93 94 95 96 97 98 99 100 101 102 1 A 5.0 V " " " " " " " GND 5.0 V GND 5.0 V GND 5.0 V GND 5.0 V GND 5.0 V GND 5.0 V GND 5.0 V GND 5.0 V IN " " " " " " " 5.0 V " " " 5.0 V OUT 5.0 V OUT GND 5.0 V OUT GND 5.0 V OUT GND 5.0 V OUT GND 5.0 V OUT IN IN OUT OUT IN IN OUT OUT IN IN OUT OUT IN IN OUT OUT 5.0 V OUT 5.0 V OUT 2 1B0 3 1B1 5.0 V 4 1Y OUT 5.0 V OUT 5 2B0 6 2B1 7 2Y 8 GND GND " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " OUT 5.0 V OUT 5.0 V OUT 5.0 V GND OUT 5.0 V GND OUT 5.0 V GND OUT 5.0 V GND OUT OUT IN IN OUT OUT IN IN OUT OUT IN IN OUT OUT IN IN OUT 5.0 V OUT 5.0 V OUT 5.0 V OUT 5.0 V 9 4Y 10 4B1 11 4B0 12 3Y 13 3B1 14 3B0 15 G IN " " " " " " " GND " " " " " " " " " " " " " " " " " " " " " " " IN " " " 16 VCC 5.0 V " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " Meas. terminal G to 1Y G to 2Y G to 3Y G to 4Y G to 1Y G to 2Y G to 3Y G to 4Y 1B0 to 1Y 1B1 to 1Y 2B0 to 2Y 2B1 to 2Y 3B0 to 3Y 3B1 to 3Y 4B0 to 4Y 4B1 to 4Y 1B0 to 1Y 1B1 to 1Y 2B0 to 2Y 2B1 to 2Y 3B0 to 3Y 3B1 to 3Y 4B0 to 4Y 4B1 to 4Y A to1Y A to 2Y A to 3Y A to 4Y A to1Y A to 2Y A to 3Y A to 4Y G to 1Y G to 2Y G to 3Y G to 4Y Test limits Min 3 " " " " " " " " " " " " " " " " " " " " " " " 6 " " " " " " " 3 " " " Max 28 " " " 23 " " " 20 " " " " " " " 20 " " " " " " " 49 " " " 41 " " " 39 " " " Unit ns " " " " " " " " " " " " " " " " " MIL-M-38510/14E " " " " " " " " " " " " " " " " " " 49 tPHL1 " TC = 125C " " " " " " " " " " " " tPLH1 " " " tPHL2 " " " See notes at end of device type 05. TABLE III. Group A inspection for device type 05 - Continued. Terminal conditions (pins not designated may be H 2.0 V, or L 0.8 V, or open). MIL- Cases E, F Subgroup Symbol STD-883 method Test No. 10 TC = 125C " " " " " " " " " " " " " " " " " " 11 tPLH2 " " " tPHL3 " " " " " " " tPLH3 " " " " " " " 3003 (Fig 6) " " " " " " " " " " " " " " " " " " 103 104 105 106 107 108 109 110 111 112 113 114 115 116 117 118 119 120 121 122 1 A 5.0 V " " " GND 5.0 V GND 5.0 V GND 5.0 V GND 5.0 V GND 5.0 V GND 5.0 V GND 5.0 V GND 5.0 V IN IN OUT OUT IN IN OUT OUT IN IN OUT OUT IN IN OUT OUT 2 1B0 3 1B1 5.0 V 4 1Y OUT 5.0 V OUT 5 2B0 6 2B1 7 2Y 8 GND GND " " " " " " " " " " " " " " " " " " " OUT OUT IN IN OUT OUT IN IN OUT OUT IN IN OUT OUT IN IN OUT 5.0 V OUT 5.0 V 9 4Y 10 4B1 11 4B0 12 3Y 13 3B1 14 3B0 15 G IN " " " GND " " " " " " " " " " " " " " " 16 VCC 5.0 V " " " " " " " " " " " " " " " " " " " Meas. terminal G to 1Y G to 2Y G to 3Y G to 4Y 1B0 to 1Y 1B1 to 1Y 2B0 to 2Y 2B1 to 2Y 3B0 to 3Y 3B1 to 3Y 4B0 to 4Y 4B1 to 4Y 1B0 to 1Y 1B1 to 1Y 2B0 to 2Y 2B1 to 2Y 3B0 to 3Y 3B1 to 3Y 4B0 to 4Y 4B1 to 4Y Test limits Min 3 " " " " " " " " " " " " " " " " " " " Max 33 " " " 25 " " " " " " " 35 " " " " " " " Unit ns " " " " " " " " " " " " " " " " " " " MIL-M-38510/14E Same tests, terminal conditions and limits as subgroup 10, except TC = -55C. 50 1/ A = 3.0 V minimum, B = 0.0 V or GND. 2/ H > 1.5 V; L < 1.5 V. Only attributes data is required for subgroups 7 and 8. TABLE III. Group A inspection for device type 06. Terminal conditions (pins not designated may be H 2.0 V, or L 0.8 V, or open). MILCases E, F Subgroup Symbol STD-883 Test No. method 1 TC = 25C " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " VOH VOH VOL VOL VIC " " " " " " " " " " " IIL " " " " " " " " " " " IIH1 " " " " " " " " " " " 3009 " " " " " " " " " " " 3010 " " " " " " " " " " " 3006 3006 3007 3007 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 32 33 34 35 36 37 38 39 40 1 D3 2 D2 3 D1 4 D0 5 Y 6 W 7 G 8 GND 9 C 10 B 0.8 V 2.0 V 2.0 V 0.8 V 11 A 0.8 V 2.0 V 2.0 V 0.8 V 12 D7 13 D6 14 D5 15 D4 Meas. terminal Min 4.5 V Y 2.4 " W 2.4 " Y " W " D0 " D1 " D2 " D3 " D4 " D5 " D6 " D7 " G " A " B " C 5.5 V G -0.7 " A " " B " " C " " " D0 " " D1 " " D2 " " D3 " " D4 " " D5 " " D6 " " D7 " G " A " B " C " D0 " D1 " D2 " D3 " D4 " D5 " D6 " D7 VCC 16 Test limits Max Unit V " " " " " " " " " " " " 2.0 V -0.8 mA 2.0 V -12 mA -12 mA -12 mA -12 mA 0.8 V -0.8 mA 2.0 V 16 mA 2.0 V 16 mA 0.8 V 0.4 V 0.4 V 0.4 V 0.4 V 2.4 V 2.4 V 2.4 V 2.4 V GND 0.8 V " 2.0 V 2.0 V " " 0.8 V " " " " " " " " -12 mA " " " " -12 mA 0.4 V " 5.5 V GND " 5.5 V " " 5.5 V " " 0.4 V " " GND " " " " " " " " " " " 5.5 V " " " " " " " " " GND 2.4 V " 5.5 V " GND " " GND " " 2.4 V " " 5.5 V " " " " " " " " " " " GND " " " " " " " " " -12 mA -12 mA -12 mA -12 mA -12 mA -12 mA 5.5 V 5.5 V 0.4 V 5.5 V GND GND 5.5 V 5.5 V GND GND 5.5 V 5.5 V GND GND 2.4 V GND 5.5 V 5.5 V GND GND 5.5 V 5.5 V GND " 5.5 V 0.4 V 5.5 V 5.5 V GND 5.5 V GND 5.5 V GND 5.5 V GND 5.5 V GND 2.4 V GND GND 5.5 V GND 5.5 V GND 5.5 V GND 5.5 V GND 0.4 V 0.4 V 0.4 V 0.4 V 2.4 V 2.4 V 2.4 V 2.4 V 0.4 0.4 -1.5 " " " " " " " " " " " -1.6 " " " " " " " " " " " 40 " " " " " " " " " " " MIL-M-38510/14E " " " mA " " " " " " " " " " " A " " " " " " " " " " " 51 See note at end of device type 06. TABLE III. Group A inspection for device type 06 - Continued. Terminal conditions (pins not designated may be H 2.0 V, or L 0.8 V, or open). Subgroup MILCases E, F Symbol STD-883 Test No. method IIH2 " " " " " " " " " " " IOS IOS ICC 3010 " " " " " " " " " " " 3011 3011 3005 41 42 43 44 45 46 47 48 49 50 51 52 53 54 55 GND " " GND " " GND " " GND 5.5 V 5.5 V GND GND 1 D3 2 D2 3 D1 4 D0 5 Y 6 W 7 G 5.5 V " " " " " " " " " " " " GND GND 8 GND GND " " " " " " " " " " " " " " 9 C GND " " 5.5 V " " " " GND " " " " " " 10 B GND GND 5.5 V GND 5.5 V 5.5 V GND GND 5.5 V 5.5 V GND " " " " 11 A GND 5.5 V GND GND 5.5 V GND 5.5 V GND 5.5 V GND 5.5 V GND " " " 5.5 V GND " " GND " " GND " " GND " " 12 D7 13 D6 14 D5 15 D4 Meas. terminal Min 5.5 V G " A " B " C " D0 " D1 " D2 " D3 " D4 " D5 " D6 VCC " " " " D7 W Y VCC -20 -20 16 Test limits Max 100 " " " " " " " " " " " -55 -55 48 Unit A " " " " " " " " " " " mA mA mA 1 TC = 25C " " " " " " " " " " " " " 2 3 7 TC = 25C " 5.5 V 5.5 V 5.5 V 5.5 V 5.5 V 5.5 V 5.5 V Same tests, terminal conditions and limits as subgroup 1, except TC = 125C and VIC tests are omitted. Same tests, terminal conditions and limits as subgroup 1, except TC = -55C and VIC tests are omitted. Truth 56 1/ L 2/ H A GND table test " " " " " " " " " " " " " " 57 58 59 60 61 62 63 64 65 66 67 68 69 70 71 72 B A B A B A B A L H L H L H L H L H L H L H L H H L H L H L H L H L H L H L H L B " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " B " " " " " " " A " " " " " " " B " " " A " " " B " " " A " " " B B A A B B A A B B A A B B A A B A B A B A B A MIL-M-38510/14E 4.5 V " " " " " " " " " " " " " " " " 2/ 52 " " " " " " " " " " " " " " 8 Repeat subgroup 7 at TC = 125C and TC = -55C. See notes at end of device type 06. TABLE III. Group A inspection for device type 06 - Continued. Terminal conditions (pins not designated may be H 2.0 V, or L 0.8 V, or open). MILCases E, F Subgroup Symbol STD-883 Test No. method 9 TC = 25C " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " tPHL1 " " tPLH1 " " tPHL2 " " tPLH2 " " tPHL3 tPLH3 tPHL4 tPLH4 tPHL5 " " " tPHL5 " " " tPLH5 " " " " " " " 3003 (Fig 4) " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " 73 74 75 76 77 78 79 80 81 82 83 84 85 86 87 88 89 90 91 92 93 94 95 96 97 98 99 100 101 102 103 104 IN IN IN IN IN IN IN 5.0 V 5.0 V 5.0 V 5.0 V 5.0 V 5.0 V 5.0 V 1 D3 2 D2 3 D1 5.0 V 4 D0 GND " " " " " " " " " " " 5.0 V " " " IN OUT OUT OUT " " " OUT " " " " " " " " " " " OUT " " " " " OUT OUT 5 Y 6 W OUT " " " " " 7 G GND " " " " " " " " " " " IN " " " GND " " " GND " " " " " " " " " " " 8 GND GND " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " 9 C GND GND IN GND GND IN GND GND IN GND GND IN GND " " " " " " " 5.0 V " " " GND " " " 5.0 V " " " 10 B GND IN GND GND IN GND GND IN GND GND IN GND " " " " " " 5.0 V 5.0 V GND GND 5.0 V 5.0 V GND GND 5.0 V 5.0 V GND GND 5.0 V 5.0 V 11 A IN GND GND IN GND GND IN GND GND IN GND " " " " " " 5.0 V GND 5.0 V GND 5.0 V GND 5.0 V GND 5.0 V GND 5.0 V GND 5.0 V GND 5.0 V IN IN IN IN IN IN IN IN 5.0 V 5.0 V 5.0 V 5.0 V 12 D7 13 D6 14 D5 15 D4 16 VCC 5.0 V " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " Meas. terminal Min A to W B to W C to W A to W B to W C to W A to Y B to Y C to Y A to Y B to Y C to Y G to W G to W G to Y G to Y D0 to W D1 to W D2 to W D3 to W D4 to W D5 to W D6 to W D7 to W D0 to W D1 to W D2 to W D3 to W D4 to W D5 to W D6 to W D7 to W 6 " " " " " 8 " " " " " 6 6 8 8 3 " " " " " " " " " " " " " " " Test limits Max 32 " " 29 " " 40 " " 39 " " 28 26 37 35 20 " " " " " " " 17 " " " " " " " Unit ns " " " " " " " " " " " " MIL-M-38510/14E " " " " " " " " " " " " " " " " " " " 53 See notes at end of device type 06. TABLE III. Group A inspection for device type 06 - Continued. Terminal conditions (pins not designated may be H 2.0 V, or L 0.8 V, or open). MILCases E, F Subgroup Symbol STD-883 Test No. method 9 TC = 25C " " " " " " " " " " " " " " 10 tPHL6 " " " " " " " tPLH6 " " " " " " " 3003 (Fig 4) " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " 105 106 107 108 109 110 111 112 113 114 115 116 117 118 119 120 121 122 123 124 125 126 127 128 129 130 131 132 133 134 135 136 137 138 139 140 IN IN IN 5.0 V 5.0 V 5.0 V 5.0 V 5.0 V 5.0 V 5.0 V 5.0 V GND " " " " " " " " " " " 5.0 V " " " IN OUT OUT OUT " " " OUT " " " " " OUT OUT IN IN IN IN IN IN IN 1 D3 2 D2 3 D1 4 D0 IN 5 Y OUT " " " " " " " " " " " " " " " OUT " " " " " 6 W 7 G GND " " " " " " " " " " " " " " " " " " " " " " " " " " " IN " " " GND " " " 8 GND GND " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " 9 C GND " " " 5.0 V " " " GND " " " 5.0 V " " " GND GND IN GND GND IN GND GND IN GND GND IN GND " " " " " " " 10 B GND GND 5.0 V 5.0 V GND GND 5.0 V 5.0 V GND GND 5.0 V 5.0 V GND GND 5.0 V 5.0 V GND IN GND GND IN GND GND IN GND GND IN GND " " " " " " 5.0 V 5.0 V 11 A GND 5.0 V GND 5.0 V GND 5.0 V GND 5.0 V GND 5.0 V GND 5.0 V GND 5.0 V GND 5.0 V IN GND GND IN GND GND IN GND GND IN GND " " " " " " 5.0 V GND 5.0 V 5.0 V 5.0 V 5.0 V 5.0 V IN IN IN IN IN IN IN IN 12 D7 13 D6 14 D5 15 D4 16 VCC 5.0 V " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " " Meas. terminal Min D0 to Y D1 to Y D2 to Y D3 to Y D4 to Y D5 to Y D6 to Y D7 to Y D0 to Y D1 to Y D2 to Y D3 to Y D4 to Y D5 to Y D6 to Y D7 to Y A to W B to W C to W A to W B to W C to W A to Y B to Y C to Y A to Y B to Y C to Y G to W G to W G to Y G to Y D0 to W D1 to W D2 to W D3 to W 6 " " " " " " " " " " " " " " " " " " " " " 8 " " " " " 6 6 8 8 3 " " " Test limits Max 29 " " " " " " " 33 " " " " " " " 48 " " 43 " " 60 " " 58 " " 38 35 52 52 32 " " " Unit ns " " " " " " " " " " " " MIL-M-38510/14E " " " " " " " " " " " " " " " " " " " " " " " tPHL1 " TC = 125C " " " " " " " " " " " " " " " " " " " tPLH1 " " tPHL2 " " tPLH2 " " tPHL3 tPLH3 tPHL4 tPLH4 tPHL5 " " " 54 See notes at end of device type 06. TABLE III. Group A inspection for device type 06 - Continued. Terminal conditions (pins not designated may be H 2.0 V, or L 0.8 V, or open). MILCases E, F Subgroup Symbol STD-883 Test No. method 10 TC = 125C " " " " " " " " " " " " " " " " " " " " " " " " " " 11 tPHL5 " " " tPLH5 " " " " " " " tPHL6 " " " " " " " tPLH6 " " " " " " " 3003 (Fig 4) " " " " " " " " " " " " " " " " " " " " " " " " " " 141 142 143 144 145 146 147 148 149 150 151 152 153 154 155 156 157 158 159 160 161 162 163 164 165 166 167 168 IN IN IN IN IN IN IN IN OUT " " " " " " " " " " " " " " " IN IN IN IN 1 D3 2 D2 3 D1 4 D0 5 Y 6 W OUT " " " " " " " " " " " 7 G GND " " " " " " " " " " " " " " " " " " " " " " " " " " " 8 GND GND " " " " " " " " " " " " " " " " " " " " " " " " " " " 9 C 5.0 V " " " GND " " " 5.0 V " " " GND " " " 5.0 V " " " GND " " " 5.0 V " " " 10 B GND GND 5.0 V 5.0 V GND GND 5.0 V 5.0 V GND GND 5.0 V 5.0 V GND GND 5.0 V 5.0 V GND GND 5.0 V 5.0 V GND GND 5.0 V 5.0 V GND GND 5.0 V 5.0 V 11 A GND 5.0 V GND 5.0 V GND 5.0 V GND 5.0 V GND 5.0 V GND 5.0 V GND 5.0 V GND 5.0 V GND 5.0 V GND 5.0 V GND 5.0 V GND 5.0 V GND 5.0 V GND 5.0 V IN IN IN IN IN IN IN IN IN IN IN IN IN IN IN 12 D7 13 D6 14 D5 15 D4 IN 16 VCC Meas. terminal Min 3 " " " " " " " " " " " 6 " " " " " " " " " " " " " " " Test limits Max 32 " " " 26 " " " " " " " 44 " " " " " " " 36 " " " " " " " Unit ns " " " " " " " " " " " " " " " " 5.0 V D4 to W " D5 to W " D6 to W " " " " " " " " " " " " " " " " " " " " " " " " " D7 to W D0 to W D1 to W D2 to W D3 to W D4 to W D5 to W D6 to W D7 to W D0 to Y D1 to Y D2 to Y D3 to Y D4 to Y D5 to Y D6 to Y D7 to Y D0 to Y D1 to Y D2 to Y D3 to Y D4 to Y D5 to Y D6 to Y D7 to Y 55 MIL-M-38510/14E " " " " " " " " " " " Same tests, terminal conditions and limits as subgroup 10, except TC = -55C. 1/ A = 3.0 V minimum, B = 0.0 V or GND. 2/ H > 1.5 V; L < 1.5 V. Only attributes data is required for subgroups 7 and 8. MIL-M-38510/14E 5. PACKAGING 5.1 Packaging requirements. For acquisition purposes, the packaging requirements shall be as specified in the contract or order (see 6.2). When packaging of materiel is to be performed by DoD or in-house contractor personnel, these personnel need to contact the responsible packaging activity to ascertain packaging requirements. Packaging requirements are maintained by the Inventory Control Point's packaging activity within the Military Service or Defense Agency, or within the military service's system command. Packaging data retrieval is available from the managing Military Department's or Defense Agency's automated packaging files, CD-ROM products, or by contacting the responsible packaging activity. 6. NOTES (This section contains information of a general or explanatory nature that may be helpful, but it not mandatory) 6.1 Intended use. Microcircuits conforming to this specification are intended for original equipment design applications and logistic support of existing equipment. 6.2 Acquisition requirements. Acquisition documents should specify the following: a. Title, number, and date of the specification. b. PIN and compliance identifier, if applicable (see 1.2). c. Requirements for delivery of one copy of the conformance inspection data pertinent to the device inspection lot to be supplied with each shipment by the device manufacturer, if applicable. d. Requirement for certificate of compliance, if applicable. e. Requirements for notification of change of product or process to acquiring activity in addition to notification to the qualifying activity, if applicable. f. Requirements for failure analysis (including required test condition of method 5003), corrective action and reporting of results, if applicable. g. Requirements for product assurance options. h. Requirements for carriers, special lead lengths or lead forming, if applicable. These requirements shall not affect the part number. Unless otherwise specified, these requirements will not apply to direct purchase by or direct shipment to the Government. i. Requirements for "JAN" marking. j. Packaging requirements (see 5.1). 6.3 Qualification. With respect to products requiring qualification, awards will be made only for products which are, at the time of award of contract, qualified for inclusion in Qualified Manufacturers List QML-38535 whether or not such products have actually been so listed by that date. The attention of the contractors is called to these requirements, and manufacturers are urged to arrange to have the products that they propose to offer to the Federal Government tested for qualification in order that they may be eligible to be awarded contracts or purchase orders for the products covered by this specification. Information pertaining to qualification of products may be obtained from DSCC-VQ, 3990 E. Broad Street, Columbus, Ohio 43123-1199. 6.4 Superseding information. The requirements of MIL-M-38510 have been superseded to take advantage of the available Qualified Manufacturer Listing (QML) system provided by MIL-PRF-38535. Previous references to MIL-M38510 in this document have been replaced by appropriate references to MIL-PRF-38535. All technical requirements now consist of this specification and MIL-PRF-38535. The MIL-M-38510 specification sheet number and PIN have been retained to avoid adversely impacting existing government logistics systems and contractor's parts lists. 56 MIL-M-38510/14E 6.5 Abbreviations, symbols and definitions. The abbreviations, symbols, and definitions used herein are defined in MIL-PRF-38535 and MIL-HDBK-1331, and as follows: GND .................................................. Ground zero voltage potential VIN ..................................................... Voltage level at an input terminal VIC ..................................................... Input clamp voltage IIN ...................................................... Current-flowing into an input terminal 6.6 Logistic support. Lead materials and finishes (see 3.3) are interchangeable. Unless otherwise specified, microcircuits acquired for Government logistic support will be acquired to device class B (see 1.2.2), lead material and finish A (see 3.4). Longer lead lengths and lead forming shall not affect the part number. 6.7 Substitutability. The cross-reference information below is presented for the convenience of users. Microcircuits covered by this specification will functionally replace the listed generic-industry type. Generic-industry microcircuit types may not have equivalent operational performance characteristics across military temperature ranges or reliability factors equivalent to MIL-M-35810 device types and may have slight physical variations in relation to case size. The presence of this information should not be deemed as permitting substitution of generic-industry types for MIL-M-38510 types or as a waiver of any of the provisions of MIL-PRF-38535. Military device type 01 02 03 04 05 06 Generic-industry type 54150 9312 54153 9309 9322, 54157 54151 6.8 Manufacturers designation. Manufacturer circuits included in this specification are designated as shown in table IV herein. TABLE IV. Substitutability and manufacturers designator. Device Types Motorola Signetics Fairchild Texas Instruments D National Advanced Micro Device F A 01 02 03 04 05 06 X X X X X X B X X X X X X C E X X X X X X X X X X X X X X X 57 MIL-M-38510/14E 6.9 Changes from previous issue. Marginal notations are not used in this revision to identify changes with respect to the previous issue due to the extensiveness of the changes. Custodians: Army - CR Navy - EC Air Force - 11 DLA - CC Review activities: Army - MI, SM Navy - AS, CG, MC, SH, TD Air Force - 03, 19, 99 Preparing activity: DLA - CC (Project 5962-2103) NOTE: The activities listed above were interested in this document as of the date of this document. Since organizations and responsibilities can change, you should verify the currency of the information above using the ASSIST Online database at http://assist.daps.dla.mil. 58 |
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